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Volume 62; Issue 3

IEEE Transactions on Electron Devices

Volume 62; Issue 3

1

Device Characteristics of TSV-Based Piezoelectric Resonator With Load Capacitance and Static Capacitance Modification

Shih, Jian-Yu, Chen, Yen-Chi, Chiu, Chih-Hung, Lo, Chung-Lun, Chang, Chi-Chung, Chen, Kuan-Neng

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.51 MB

english, 2015

2

A High-Speed Wafer-Scale CMOS X-Ray Detector With Column-Parallel ADCs Using Oversampling Binning Method

Kim, Jong-Boo, Hong, Seong-Kwan, Kwon, Oh-Kyong

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 4.48 MB

english, 2015

3

A 3-D Large Signal Model for Sheet Beam Traveling Wave Tubes

Xie, Wenqiu, Wang, Zi-Cheng, Luo, Jirun, Zhao, Ding

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 3.12 MB

english, 2015

4

Atomic Level Modeling of Extremely Thin Silicon-on-Insulator MOSFETs Including the Silicon Dioxide: Electronic Structure

Markov, Stanislav, Aradi, Balint, Yam, Chi-Yung, Xie, Hang, Frauenheim, Thomas, Chen, Guanhua

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.89 MB

english, 2015

5

A Comprehensive Study on the Frequency-Dependent Electrical Characteristics of Sm2O3 MOS Capacitors

Kaya, Senol, Yilmaz, Ercan

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.21 MB

english, 2015

6

Potential Benefits and Sensitivity Analysis of Dopingless Transistor for Low Power Applications

Sahu, Chitrakant, Singh, Jawar

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.71 MB

english, 2015

7

GaAsSb/InAlAs/InGaAs Tunnel Diodes for Millimeter Wave Detection in 220–330-GHz Band

Patrashin, Mikhail, Sekine, Norihiko, Kasamatsu, Akifumi, Watanabe, Issei, Hosako, Iwao, Takahashi, Tsuyoshi, Sato, Masaru, Nakasha, Yasuhiro, Hara, Naoki

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 694 KB

english, 2015

8

Investigation of Junction Thermal Characteristics of Light-Emitting Transistors

Yang, Hao-Hsiang, Wang, Hsiao-Lun, Wu, Chao-Hsin

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.81 MB

english, 2015

9

Modeling and Separate Extraction Technique for Gate Bias-Dependent Parasitic Resistances and Overlap Length in MOSFETs

Lee, Jungmin, Bae, Hagyoul, Hwang, Jun Seok, Ahn, Jaeyeop, Jang, Jun Tae, Yoon, Jinsoo, Choi, Sung-Jin, Kim, Dae Hwan, Kim, Dong Myong

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.62 MB

english, 2015

10

Integration of TmSiO/HfO2 Dielectric Stack in Sub-nm EOT High-k/Metal Gate CMOS Technology

Dentoni Litta, Eugenio, Hellstrom, Per-Erik, Ostling, Mikael

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.38 MB

english, 2015

11

On the Origin of Steep $I$ – $V$ Nonlinearity in Mixed-Ionic-Electronic-Conduction-Based Access Devices

Padilla, Alvaro, Burr, Geoffrey W., Shenoy, Rohit S., Raman, Karthik V., Bethune, Donald S., Shelby, Robert M., Rettner, Charles T., Mohammad, Juned, Virwani, Kumar, Narayanan, Pritish, Deb, Arpan K.,

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 13.20 MB

english, 2015

12

Noise Suppression in Quantum-Dot Semiconductor Optical Amplifiers: A Bit Rate-SNR Analysis

Baghban, Hamed, Alimohammadi, Farzin

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.24 MB

english, 2015

13

Diffusion Injection in a Buried Multiquantum Well Light-Emitting Diode Structure

Riuttanen, Lauri, Kivisaari, Pyry, Svensk, Olli, Oksanen, Jani, Suihkonen, Sami

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.36 MB

english, 2015

14

Frequency-Modulated Charge Pumping With Extremely High Gate Leakage

Ryan, Jason Thomas, Zou, Jibin, Southwick, Richard, Campbell, Jason Paul, Cheung, Kin P., Oates, Anthony S., Huang, Ru

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.79 MB

english, 2015

15

Advanced Methodology for Fast 3-D TCAD Device/Circuit Electrothermal Simulation and Analysis of Power HEMTs

Chvala, Ales, Donoval, Daniel, Satka, Alexander, Molnar, Marian, Marek, Juraj, Pribytny, Patrik

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.33 MB

english, 2015

16

Differentiated Doping Profile for Vertical Terahertz GaN Transferred-Electron Devices

Dalle, Christophe Francois

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.53 MB

english, 2015

17

Versatile Compact Model for Graphene FET Targeting Reliability-Aware Circuit Design

Mukherjee, Chhandak, Aguirre-Morales, Jorge-Daniel, Fregonese, Sebastien, Zimmer, Thomas, Maneux, Cristell

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.74 MB

english, 2015

18

A Reduced-Order Method for Coherent Transport Using Green’s Functions

Hetmaniuk, Ulrich, Ji, Dong, Zhao, Yunqi, Anantram, Manjeri P.

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.00 MB

english, 2015

19

A Reconfigurable Low-Power BDD Logic Architecture Using Ferroelectric Single-Electron Transistors

Liu, Lu, Li, Xueqing, Narayanan, Vijaykrishnan, Datta, Suman

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.39 MB

english, 2015

20

AlN/SiO2/Si3N4/Si(100)-Based CMOS Compatible Surface Acoustic Wave Filter With −12.8-dB Minimum Insertion Loss

Kaletta, Udo Christian, Wipf, Christian, Fraschke, Mirko, Wolansky, Dirk, Schubert, Markus Andreas, Schroeder, Thomas, Wenger, Christian

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 944 KB

english, 2015

21

Effect of Body Thickness on the Electrical Performance of Ballistic n-Channel GaSb Double-Gate Ultrathin-Body Transistor

Guo, Yan, Zhang, Xiaoyi, Low, Kain Lu, Lam, Kai-Tak, Yeo, Yee-Chia, Liang, Gengchiau

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.70 MB

english, 2015

22

Compact Modeling of the Transient Carrier Trap/Detrap Characteristics in Polysilicon TFTs

Oodate, Yuhei, Tanimoto, Yuta, Tanoue, Hiroshi, Kikuchihara, Hideyuki, Mattausch, Hans Jurgen, Miura-Mattausch, Mitiko

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.62 MB

english, 2015

23

Comprehensive and Macrospin-Based Magnetic Tunnel Junction Spin Torque Oscillator Model- Part II: Verilog-A Model Implementation

Tingsu Chen,, Eklund, Anders, Iacocca, Ezio, Rodriguez, Saul, Malm, B. Gunnar, Akerman, Johan, Rusu, Ana

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 3.70 MB

english, 2015

24

Evaluating Chip-Level Impact of Cu/Low- $\kappa $ Performance Degradation on Circuit Performance at Future Technology Nodes

Ceyhan, Ahmet, Jung, Moongon, Panth, Shreepad, Lim, Sung Kyu, Naeemi, Azad

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.50 MB

english, 2015

25

Linear Analysis of Helix Traveling-Wave Tubes With Nonnegligible Space Charge Using the Improved Helical-Harmonics Approximation

Mahmoudi, Ali, Kamarei, Mahmoud, Shahabadi, Mahmoud

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.36 MB

english, 2015

26

Normally off Al2O3–AlGaN/GaN MIS-HEMT With Transparent Gate Electrode for Gate Degradation Investigation

Lu, Yunyou, Li, Baikui, Tang, Xi, Jiang, Qimeng, Yang, Shu, Tang, Zhikai, Chen, Kevin J.

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.74 MB

english, 2015

27

Novel Gate-All-Around High-Voltage Thin-Film Transistor With T-Shaped Metal Field Plate Design

Tsai, Jhen-Yu, Hu, Hsin-Hui

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.98 MB

english, 2015

28

TCAD-Based Simulation Method for the Electrolyte–Insulator–Semiconductor Field-Effect Transistor

Choi, Bongsik, Lee, Jieun, Yoon, Jinsu, Ahn, Jae-Hyuk, Park, Tae Jung, Kim, Dong Myong, Kim, Dae Hwan, Choi, Sung-Jin

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.29 MB

english, 2015

29

Temperature-Dependent Dynamic $R_{\mathrm {\mathrm{{\scriptstyle ON}}}}$ in GaN-Based MIS-HEMTs: Role of Surface Traps and Buffer Leakage

Meneghini, Matteo, Vanmeerbeek, Piet, Silvestri, Riccardo, Dalcanale, Stefano, Banerjee, Abhishek, Bisi, Davide, Zanoni, Enrico, Meneghesso, Gaudenzio, Moens, Peter

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.05 MB

english, 2015

30

RF Operation of Hydrogen-Terminated Diamond Field Effect Transistors: A Comparative Study

Russell, Stephen, Sharabi, Salah, Tallaire, Alexandre, Moran, David A. J.

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 5.26 MB

english, 2015

31

Optimization of Klystron Designs Using Deterministic Sampling Methods

Tran, Hien, Lankford, George, Read, Michael E., Ives, R. Lawrence, Reppert, Kelsey, Cline, Kayla, Guzman, Juan

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.03 MB

english, 2015

32

A New Physical Method Based on $CV$ – $GV$ Simulations for the Characterization of the Interfacial and Bulk Defect Density in High- $k$ /III-V MOSFETs

Sereni, Gabriele, Vandelli, Luca, Veksler, Dmitry, Larcher, Luca

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.55 MB

english, 2015

33

Series Stacked Multipath Inductor With High Self Resonant Frequency

Vanukuru, Venkata Narayana Rao, Chakravorty, Anjan

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.39 MB

english, 2015

34

Thermal Analysis of High-Power Multichip COB Light-Emitting Diodes With Different Chip Sizes

Ying, Shang-Ping, Shen, Wei-Bo

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.64 MB

english, 2015

35

Comprehensive Performance Benchmarking of III-V and Si nMOSFETs (Gate Length = 13 nm) Considering Supply Voltage and OFF-Current

Kim, Raseong, Avci, Uygar E., Young, Ian A.

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.56 MB

english, 2015

36

Comparative Performance Analysis of the Dielectrically Modulated Full- Gate and Short-Gate Tunnel FET-Based Biosensors

Kanungo, Sayan, Chattopadhyay, Sanatan, Gupta, Partha Sarathi, Rahaman, Hafizur

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.94 MB

english, 2015

37

Comprehensive and Macrospin-Based Magnetic Tunnel Junction Spin Torque Oscillator Model-Part I: Analytical Model of the MTJ STO

Tingsu Chen,, Eklund, Anders, Iacocca, Ezio, Rodriguez, Saul, Malm, B. Gunnar, Akerman, Johan, Rusu, Ana

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 3.32 MB

english, 2015

38

A SPICE Compact Model for Unipolar RRAM Reset Process Analysis

Jimenez-Molinos, Francisco, Villena, Marco A., Roldan, Juan B., Roldan, Andres M.

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2015

39

Trap-Profile Extraction Using High-Voltage Capacitance–Voltage Measurement in AlGaN/GaN Heterostructure Field-Effect Transistors With Field Plates

Liao, Wen-Chia, Chyi, Jen-Inn, Hsin, Yue-Ming

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2015

40

An Improved Quasi-Saturation and Charge Model for SOI-LDMOS Transistors

Prasad, Nitin, Sarangapani, Prasad, Nikhil, Krishnan Nadar Savithry, DasGupta, Nandita, DasGupta, Amitava, Chakravorty, Anjan

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.50 MB

english, 2015

41

Parameter Extractions for a GaAs pHEMT Thermal Model Using a TFR-Heated Test Structure

Schwitter, Bryan K., Fattorini, Anthony P., Parker, Anthony E., Mahon, Simon J., Heimlich, Michael C.

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.32 MB

english, 2015

42

Distributive Quasi-Ballistic Drift Diffusion Model Including Effects of Stress and High Driving Field

Kotlyar, Roza, Rios, Rafael, Weber, Cory E., Linton, Thomas D., Armstrong, Mark, Kuhn, Kelin

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.62 MB

english, 2015

43

Channel Temperature Analysis of GaN HEMTs With Nonlinear Thermal Conductivity

Darwish, Ali, Bayba, Andrew J., Hung, Hingloi Alfred

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.07 MB

english, 2015

44

High-Performance Enhancement-Mode Al2O3/AlGaN/GaN-on-Si MISFETs With 626 MW/ $\mathrm{cm}^{2}$ Figure of Merit

Zhou, Qi, Chen, Bowen, Jin, Yang, Huang, Sen, Wei, Ke, Liu, Xinyu, Bao, Xu, Mou, Jinyu, Zhang, Bo

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.04 MB

english, 2015

45

Vane-Loaded Planar Helix Slow-Wave Structure for Application in Broadband Traveling-Wave Tubes

Swaminathan, Krithi, Zhao, Chen, Chua, Ciersiang, Aditya, Sheel

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2015

46

Solution-Processed Low-Operating-Voltage Thin-Film Transistors With Bottom-Gate Top-Contact Structure

Li, Xifeng, Zhu, Leyong, Gao, Yana, Zhang, Jianhua

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.86 MB

english, 2015

47

Light-Emitting Diodes Fabricated From Carbon Ions Implanted Into p-Type Silicon

Purdy, Sarah K., Knights, Andrew P., Bradley, Michael Patrick, Chang, Gap Soo

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 4.35 MB

english, 2015

48

Fully Inkjet Printed RF Inductors and Capacitors Using Polymer Dielectric and Silver Conductive Ink With Through Vias

McKerricher, Garret, Perez, Jose Gonzalez, Shamim, Atif

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.58 MB

english, 2015

49

Improved Technique for Quantifying the Bias-Dependent Mobility of Metal-Oxide Thin-Film Transistors

Zeumault, Andre, Subramanian, Vivek

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.73 MB

english, 2015

50

Design of Band Engineered HgCdTe nBn Detectors for MWIR and LWIR Applications

Akhavan, Nima Dehdashti, Jolley, Gregory, Umana-Membreno, Gilberto A., Antoszewski, Jarek, Faraone, Lorenzo

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.27 MB

english, 2015

51

A Unified Two-Band Model for Oxide Traps and Interface States in MOS Capacitors

Taur, Yuan, Chen, Han-Ping, Xie, Qian, Ahn, Jaesoo, McIntyre, Paul C., Lin, Dennis, Vais, Abhitosh, Veksler, Dmitry

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.82 MB

english, 2015

52

Effect of SiO2 and SiO2/SiNx Passivation on the Stability of Amorphous Indium-Gallium Zinc-Oxide Thin-Film Transistors Under High Humidity

Chowdhury, Md Delwar Hossain, Mativenga, Mallory, Um, Jae Gwang, Mruthyunjaya, Ravi K., Heiler, Gregory N., Tredwell, Timothy John, Jang, Jin

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.83 MB

english, 2015

53

Table of contents

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 587 KB

english, 2015

54

IEEE Transactions on Electron Devices publication information

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 151 KB

english, 2015

55

Refined Conformal Mapping Model for MOSFET Parasitic Capacitances Based on Elliptic Integrals

Hiblot, Gaspard, Rafhay, Quentin, Boeuf, Frederic, Ghibaudo, Gerard

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.36 MB

english, 2015

56

Change of Editor-in-Chief

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 249 KB

english, 2015

57

Impact of Uniaxial Strain on Random Telegraph Noise in High- $k$ /Metal Gate pMOSFETs

Huang, Po-Chin, Chen, Jone F., Tsai, Shih Chang, Wu, San Lein, Tsai, Kai-Shiang, Kao, Tsung Hsien, Fang, Yean-Kuen, Lai, Chien-Ming, Hsu, Chia-Wei, Chen, Yi-Wen, Cheng, Osbert

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2015

58

Pulse-Induced Crystallization in Phase-Change Memories Under Set and Disturb Conditions

Ciocchini, Nicola, Ielmini, Daniele

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.64 MB

english, 2015

59

2015 IEEE international reliability physics symposium

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Fichier:

PDF, 1.36 MB

2015

60

IEEE Transactions on Electron Devices information for authors

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 110 KB

english, 2015

61

Investigation of Hole Mobility in Strained InSb Ultrathin Body pMOSFETs

Chang, Pengying, Liu, Xiaoyan, Zeng, Lang, Wei, Kangliang, Du, Gang

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.10 MB

english, 2015

62

Blank page

Journal:

IEEE Transactions on Electron Devices

Année:

2015

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PDF, 5 KB

2015