Comprehensive Performance Benchmarking of III-V and Si nMOSFETs (Gate Length = 13 nm) Considering Supply Voltage and OFF-Current
Kim, Raseong, Avci, Uygar E., Young, Ian A.Volume:
62
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2388708
Date:
March, 2015
Fichier:
PDF, 2.56 MB
english, 2015