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The evolution of microstructure and microhardness of Sn–Ag and Sn–Cu solders during high temperature aging
Sun-Kyoung Seo, Sung K. Kang, Da-Yuan Shih, Hyuck Mo LeeVolume:
49
Année:
2009
Langue:
english
Pages:
8
DOI:
10.1016/j.microrel.2008.11.014
Fichier:
PDF, 3.96 MB
english, 2009