Anomalous Transient Diffusion of Ion Implanted Boron during Rapid Thermal Annealing
Kim, Y. M., Lo, G. Q., Kwong, D. L., Tseng, H. H., Hance, R.Volume:
146
Langue:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-146-391
Date:
January, 1989
Fichier:
PDF, 1.57 MB
english, 1989