The effect of cooling rate on the surface reconstruction of annealed silicon(111) studied by scanning tunneling microscopy and low-energy electron diffraction: M D Pashley et al, J Vac Sci Technol, A6, 1988, 488–492
Volume:
39
Année:
1989
Langue:
english
DOI:
10.1016/0042-207x(89)91019-1
Fichier:
PDF, 149 KB
english, 1989