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Contactless characterization of the recombination process in silicon wafers: Separation between bulk and surface contribution
R. Bernini, A. Cutolo, A. Irace, P. Spirito, L. ZeniVolume:
39
Année:
1996
Langue:
english
Pages:
8
DOI:
10.1016/0038-1101(96)00013-5
Fichier:
PDF, 740 KB
english, 1996