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51

Foreword from the editors of this issue

Starikov, A. D., Rezunkov, Yu. A.

Journal:

Journal of Optical Technology

Année:

1999

Langue:

english

Fichier:

PDF, 127 KB

english, 1999

52

Tunable laser for spectrum analyzers for use on propagation paths

Korolev, V. I., Mesnyankin, E. P., Starikov, A. D.

Journal:

Journal of Optical Technology

Année:

1999

Langue:

english

Fichier:

PDF, 62 KB

english, 1999

53

Simulation of the propagation of a laser beam through a local zone of strong turbulence

Vorob'ev, V. V., Osipov, V. M., Sirazetdinov, V. S., Starikov, A. D., Sheremet'eva, T. A., Filippov, G. N., Titerton, D. G.

Journal:

Journal of Optical Technology

Année:

1999

Langue:

english

Fichier:

PDF, 575 KB

english, 1999

54

Fast mirrorÂ–lens objective for the infrared region

Potapova, N. I., Starikov, A. D., Tsvetkov, A. D.

Journal:

Journal of Optical Technology

Année:

2003

Langue:

english

Fichier:

PDF, 75 KB

english, 2003

55

Neodymium-doped yttrium aluminum garnet laser with transverse diode pumping and a system for cooling the active element with thermoelectric modules

Korolev, V. I., Mesnyankin, E. P., Starikov, A. D.

Journal:

Journal of Optical Technology

Année:

2003

Langue:

english

Fichier:

PDF, 100 KB

english, 2003

56

Molecular structure conversion of fluorescein monoanions in an electrostatic storage ring

Tanabe, T., Saito, M., Noda, K., Starikov, E.B.

Journal:

The European Physical Journal D / Atomic, Molecular, Optical and Plasma Physics

Année:

2012

Langue:

english

Fichier:

PDF, 862 KB

english, 2012

57

Investigation of turbulent exchange and wash-out by measurement of natural radioactivity in surface air

Bakulin, V. N., Senko, E. E., Starikov, B. G., Trufakin, V. A.

Journal:

Journal of Geophysical Research

Année:

1970

Langue:

english

Fichier:

PDF, 430 KB

english, 1970

58

Investigation of high-frequency small-signal characteristics of FETs/HEMTs

Starikov, E, Shiktorov, P, Gružinskis, V

Journal:

Semiconductor Science and Technology

Année:

2012

Langue:

english

Fichier:

PDF, 691 KB

english, 2012

59

Method of computer generation and projection recording of microholograms for holographic memory systems: mathematical modelling and experimental implementation

Betin, A Yu, Bobrinev, V I, Evtikhiev, N N, Zherdev, A Yu, Zlokazov, E Yu, Lushnikov, D S, Markin, V V, Odinokov, S B, Starikov, S N, Starikov, R S

Journal:

Quantum Electronics

Année:

2013

Langue:

english

Fichier:

PDF, 1.64 MB

english, 2013

60

Theoretical prediction of perfect spin filtering at interfaces between close-packed surfaces of Ni or Co and graphite or graphene

Karpan, V. M., Khomyakov, P. A., Starikov, A. A., Giovannetti, G., Zwierzycki, M., Talanana, M., Brocks, G., van den Brink, J., Kelly, P. J.

Journal:

Physical Review B

Année:

2008

Langue:

english

Fichier:

PDF, 2.96 MB

english, 2008

61

Unified First-Principles Study of Gilbert Damping, Spin-Flip Diffusion, and Resistivity in Transition Metal Alloys

Starikov, Anton A., Kelly, Paul J., Brataas, Arne, Tserkovnyak, Yaroslav, Bauer, Gerrit E. W.

Journal:

Physical Review Letters

Année:

2010

Langue:

english

Fichier:

PDF, 253 KB

english, 2010

62

Proceedings of SPIE [SPIE Gallium Nitride Materials and Devices VII - San Francisco, California, USA (Monday 23 January 2012)] - Hardened planar nitride based cold cathode electron emitter

Pillai, R., Starikov, D., Boney, C., Bensaoula, A.

Année:

2012

Langue:

english

Fichier:

PDF, 236 KB

english, 2012

63

Weak hydrogen bonding. Part 2. The hydrogen bonding nature of short C?H ?? contacts: crystallographic, spectroscopic and quantum mechanical studies of some terminal alkynes

Steiner, Thomas, Starikov, Evgeni B., Amado, Ana M., Teixeira-Dias, Jos� J. C.

Journal:

Journal of the Chemical Society Perkin Transactions 2

Année:

1995

Langue:

english

Fichier:

PDF, 849 KB

english, 1995

64

De novo Folding of Two-Helix Potassium Channel Blockers with Free-Energy Models and Molecular Dynamics

Quintilla, Aina, Starikov, Evgeni, Wenzel, Wolfgang

Journal:

Journal of Chemical Theory and Computation

Année:

2007

Langue:

english

Fichier:

PDF, 748 KB

english, 2007

65

Initial state of an enzymic reaction. Theoretical prediction of complex formation in the active site of RNase T1

Cordes, F., Starikov, E. B., Saenger, W.

Journal:

Journal of the American Chemical Society

Année:

1995

Langue:

english

Fichier:

PDF, 3.74 MB

english, 1995

66

Interatomic potential for uranium in a wide range of pressures and temperatures

Smirnova, D E, Starikov, S V, Stegailov, V V

Journal:

Journal of Physics Condensed Matter

Année:

2012

Langue:

english

Fichier:

PDF, 799 KB

english, 2012

67

Small-signal analysis of the Boltzmann equation from harmonic- and impulse-response methods

Vaissiere, J. C., Nougier, J. P., Varani, L., Houlet, P., Hlou, L., Starikov, E., Shiktorov, P., Reggiani, L.

Journal:

Physical Review B

Année:

1994

Langue:

english

Fichier:

PDF, 551 KB

english, 1994

68

diode generators

Gružinskis, V., Starikov, E., Shiktorov, P., Reggiani, L., Varani, L.

Journal:

Physical Review B

Année:

1994

Langue:

english

Fichier:

PDF, 391 KB

english, 1994

69

Folding of Oligoglutamines: A Theoretical Approach Based Upon Thermodynamics and Molecular Mechanics

Starikov, E. B., Lehrach, H., Wanker, E. E.

Journal:

Journal of Biomolecular Structure and Dynamics

Année:

1999

Langue:

english

Fichier:

PDF, 1.78 MB

english, 1999

70

Editorial: The Makers and Users of Scientific Instruments

Boney, Chris, Starikov, David, Hernandez, Ivan, Pillai, Rajeev, Bensaoula, Abdelhak

Journal:

Review of Scientific Instruments

Année:

1940

Langue:

english

Fichier:

PDF, 402 KB

english, 1940

71

Monte Carlo calculation of noise and small-signal impedance spectra in submicrometer GaAs n+nn+ diodes

Starikov, E., Shiktorov, P., Gružinskis, V., Varani, L., Vaissiere, J. C., Nougier, J. P., Reggiani, L.

Journal:

Journal of Applied Physics

Année:

1996

Langue:

english

Fichier:

PDF, 478 KB

english, 1996

72

Investigation of point defects diffusion in bcc uranium and U–Mo alloys

Smirnova, D.E., Kuksin, A.Yu., Starikov, S.V.

Journal:

Journal of Nuclear Materials

Année:

2015

Langue:

english

Fichier:

PDF, 1.79 MB

english, 2015

73

Measurements and calculations of He-broadening and -shifting parameters of the water vapor transitions of the ν 1 + ν 2 + ν 3 band

Petrova, T.M., Solodov, A.M., Starikov, V.I., Solodov, A.A.

Journal:

Molecular Physics

Année:

2012

Langue:

english

Fichier:

PDF, 252 KB

english, 2012

74

SCREW MOTION OF DNA DUPLEX DURING TRANSLOCATION THROUGH PORE I: INTRODUCTION OF THE COARSE-GRAINED MODEL

STARIKOV, E. B., HENNIG, D., YAMADA, H., GUTIERREZ, R., NORDÉN, B., CUNIBERTI, G.

Journal:

Biophysical Reviews and Letters

Année:

2009

Langue:

english

Fichier:

PDF, 416 KB

english, 2009

75

[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - High-speed front end for LED-Photodiode based fluorescence lifetime measurement system

Joseph, Clement, Boukadoum, Mounir, Charlson, Joe, Starikov, David, Bensaoula, Abdelhak

Année:

2007

Langue:

english

Fichier:

PDF, 340 KB

english, 2007

76

Modified temporal noise measurement method with automatic segmentation of nonuniform target, its accuracy estimation, and application to cameras of different types

Cheremkhin, Pavel A., Evtikhiev, Nikolay N., Krasnov, Vitaly V., Rodin, Vladislav G., Starikov, Sergey N.

Journal:

Optical Engineering

Année:

2014

Langue:

english

Fichier:

PDF, 2.78 MB

english, 2014

77

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Mueller based scatterometry measurement of nanoscale structures with anisotropic in-plane optical properties

Muthinti, Gangadhara R., Medikonda, Manasa, Fronheiser, Jody, Kamineni, Vimal K., Peterson, Brennan, Race, Joseph, Diebold, Alain C., Starikov, Alexander, Cain, Jason P.

Année:

2013

Langue:

english

Fichier:

PDF, 1.65 MB

english, 2013

78

SPIE Proceedings [SPIE Advanced Microelectronic Manufacturing - Santa Clara, CA (Sunday 23 February 2003)] Design and Process Integration for Microelectronic Manufacturing - Device characteristics of sub-20-nm silicon nanotransistors

Saha, Samar, Starikov, Alexander

Année:

2003

Langue:

english

Fichier:

PDF, 152 KB

english, 2003

79

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Photoluminescence metrology for LED characterization in high volume manufacturing

Raymond, Christopher J., Li, Zhiqiang, Starikov, Alexander, Cain, Jason P.

Année:

2013

Langue:

english

Fichier:

PDF, 751 KB

english, 2013

80

Laser system emitting 100 mJ in Laguerre—Gaussian modes

Bagdasarov, V Kh, Garnov, Sergei V, Denisov, N N, Malyutin, A A, Dolgopolov, Yu V, Kopalkin, A V, Starikov, F A

Journal:

Quantum Electronics

Année:

2009

Langue:

english

Fichier:

PDF, 681 KB

english, 2009

81

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Metrology, Inspection, and Process Control for Microlithography XXVI - Coherent Fourier scatterometry: tool for improved sensitivity in semiconductor metrology

Kumar, N., El Gawhary, O., Roy, S., Kutchoukov, V. G., Pereira, S. F., Coene, W., Urbach, H. P., Starikov, Alexander

Année:

2012

Langue:

english

Fichier:

PDF, 2.01 MB

english, 2012

82

Quantum-chemical model for the formation of the coordination mode structure of Be(II), Ni(II), Pd(II), Pt(II), and Hg(II) bis(chelate) complexes with polydentate azomethine ligands

Kharabayev, N. N., Starikov, A. G., Minkin, V. I.

Journal:

Russian Journal of Coordination Chemistry

Année:

2015

Langue:

english

Fichier:

PDF, 727 KB

english, 2015

83

Quantifying Patient-Physician Communication and Perceptions of Risk During Admissions for Possible Acute Coronary Syndromes

Newman, David H., Ackerman, Brian, Kraushar, Matthew L., Lederhandler, Margo H., Masri, Amal, Starikov, Anna, Tsao, Daisy T., Meyers, H. Pendell, Shah, Kaushal H.

Journal:

Annals of Emergency Medicine

Année:

2015

Langue:

english

Fichier:

PDF, 855 KB

english, 2015

84

Recognizing objects from the spatial and spectral parameters in dispersion holographic correlators

Rodin, V. G., Starikov, S. N.

Journal:

Journal of Optical Technology

Année:

2012

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2012

85

Estimating how the dynamic range and noise of the recording cameras affect the quality of digital holograms

Evtikhiev, N. N., Starikov, S. N., Cheremkhin, P. A.

Journal:

Journal of Optical Technology

Année:

2013

Langue:

english

Fichier:

PDF, 559 KB

english, 2013

86

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Vibration-rotation polarizability operator for nonlinear X2Y-type molecules and the rovibrational Raman cross-section calculation of water molecules

Starikov, V. I., Protasevich, A. E., Sinitsa, Leonid N., Mikhailenko, Semen N.

Année:

2012

Langue:

english

Fichier:

PDF, 189 KB

english, 2012

87

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Performance of ASML YieldStar μDBO overlay targets for advanced lithography nodes C028 and C014 overlay process control

Blancquaert, Yoann, Dezauzier, Christophe, Depre, Jerome, Miqyass, Mohamed, Beltman, Jan, Starikov, Alexander, Cain, Jason P.

Année:

2013

Langue:

english

Fichier:

PDF, 1006 KB

english, 2013

88

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Screening of singular points of vector field of phase gradient, localization of optical vortices and reconstruction of wavefront with screw dislocations

Aksenov, Valerii P., Izmailov, Igor V., Kanev, Feodor Yu., Starikov, Feodor A., Arecchi, Tito, Gurov, Igor P., Yatagai, Toyohiko, Panchenko, Vladislav Ya., Golubev, Vladimir S.

Année:

2012

Langue:

english

Fichier:

PDF, 602 KB

english, 2012

89

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - In-die overlay metrology method using defect review SEM images

Oh, Jaehyoung, Kwon, Gwangmin, Mun, Daiyoung, Yoo, Hyungwon, Kim, Sungsu, Kim, Tae hui, Harada, Minoru, Minekawa, Yohei, Fukunaga, Fumihiko, Nozoe, Mari, Starikov, Alexander, Cain, Jason P.

Année:

2013

Langue:

english

Fichier:

PDF, 3.42 MB

english, 2013

90

Effect of gate-length shortening on the terahertz small-signal and self-oscillations characteristics of field-effect transistors

Starikov, E., Shiktorov, P., Gružinskis, V., Marinchio, H., Palermo, C., Varani, L.

Journal:

Solid-State Electronics

Année:

2015

Langue:

english

Fichier:

PDF, 710 KB

english, 2015

91

Analytical model of high-frequency noise spectrum in Schottky-barrier diodes

Shiktorov, P., Starikov, E., Gruzinskis, V., Reggiani, L., Varani, L., Vaissiere, J.C.

Journal:

IEEE Electron Device Letters

Année:

2005

Langue:

english

Fichier:

PDF, 126 KB

english, 2005

92

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Metrology, Inspection, and Process Control for Microlithography XXVI - Overlay accuracy fundamentals

Kandel, Daniel, Levinski, Vladimir, Sapiens, Noam, Cohen, Guy, Amit, Eran, Klein, Dana, Vakshtein, Irina, Starikov, Alexander

Année:

2012

Langue:

english

Fichier:

PDF, 742 KB

english, 2012

93

Highly wear-resistant and biocompatible carbon nanocomposite coatings for dental implants

Penkov, Oleksiy V., Pukha, Vladimir E., Starikova, Svetlana L., Khadem, Mahdi, Starikov, Vadym V., Maleev, Maxim V., Kim, Dae-Eun

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 1.58 MB

english, 2016

94

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Metrology, Inspection, and Process Control for Microlithography XXVI - Contour metrology using critical dimension atomic force microscopy

Orji, Ndubuisi G., Dixson, Ronald G., Vladár, András E., Ming, Bin, Postek, Michael T., Starikov, Alexander

Année:

2012

Langue:

english

Fichier:

PDF, 1.32 MB

english, 2012

95

SPIE Proceedings [SPIE Design, Process Integration, and Characterization for Microelectronics - Santa Clara, CA (Wednesday 6 March 2002)] Design, Process Integration, and Characterization for Microelectronics - Investigation of the physical and practical limits of dense-only phase-shift lithography for circuit feature definition

Tyrrell, Brian, Fritze, Michael, Mallen, Renee D., Wheeler, Bruce, Rhyins, Peter D., Martin, Patrick M., Starikov, Alexander, Tobin, Jr., Kenneth W.

Année:

2002

Langue:

english

Fichier:

PDF, 878 KB

english, 2002

96

SPIE Proceedings [SPIE Advanced Microelectronic Manufacturing - Santa Clara, CA (Sunday 23 February 2003)] Design and Process Integration for Microelectronic Manufacturing - NBTI improvement for pMOS by Cl-contained 1st oxidation in 20A/65A dual-nitrided gate oxide of 0.13-μm CMOS technology

Hao, Ching-Chen, Chi, Min-Hwa, Chen, Chao-Chi, Lin, Hung-Jen, Lin, Yu-Fang, Hsieh, C. H., Lee, Chih-Hsiung, Chang, Kuang-Hui, Wu, H. T., Shen, Chin-Heng, Starikov, Alexander

Année:

2003

Langue:

english

Fichier:

PDF, 231 KB

english, 2003

97

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Metrology, Inspection, and Process Control for Microlithography XXVI - Overlay control methodology comparison: field-by-field and high-order methods

Huang, Chun-Yen, Chiu, Chui-Fu, Wu, Wen-Bin, Shih, Chiang-Lin, Huang, Chin-Chou Kevin, Huang, Healthy, Choi, DongSub, Pierson, Bill, Robinson, John C., Starikov, Alexander

Année:

2012

Langue:

english

Fichier:

PDF, 3.92 MB

english, 2012

98

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - High order wafer alignment for 20nm node logic process

Jeon, Bumhwan, Pal, Shyam, Mehta, Sohan, Lokesh, Subramany, Jiang, Yun Tao, Li, Chen, Yelverton, Mark, Wei, Yayi, Starikov, Alexander, Cain, Jason P.

Année:

2013

Langue:

english

Fichier:

PDF, 369 KB

english, 2013

99

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Application of DBM tool for detection of EUV mask defect

Yoo, Gyun, Kim, Jungchan, Park, Chanha, Lee, Taehyeong, Ji, Sunkeun, Yang, Hyunjo, Yim, Donggyu, Park, Byeongjun, Maruyama, Kotaro, Yamamoto, Masahiro, Starikov, Alexander, Cain, Jason P.

Année:

2013

Langue:

english

Fichier:

PDF, 703 KB

english, 2013

100

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - When things go pear shaped: contour variations of contacts

Utzny, Clemens, Starikov, Alexander, Cain, Jason P.

Année:

2013

Langue:

english

Fichier:

PDF, 644 KB

english, 2013