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1

[IEEE 2014 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2014.3.9-2014.3.13)] 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - ELDO-COMSOL based 3D electro-thermal simulations of power semiconductor devices

De Falco, G., Riccio, M., Romano, G., Maresca, L., Irace, A., Breglio, G.

Année:

2014

Langue:

english

Fichier:

PDF, 508 KB

english, 2014

2

1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention

Lucio Rossi, M. Riccio, E. Napoli, A. Irace, G. Breglio, P. Spirito

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 748 KB

english, 2009

3

[IEEE 2006 IEEE International Symposium on Power Semiconductor Devices & IC's - Naples, Italy (04-08 June 2006)] 2006 IEEE International Symposium on Power Semiconductor Devices & IC's - Influence of Layout Geometries on the Behavior of 4H-SiC 600V Merged PiN Schottky (MPS) Rectifiers

d'Alessandro, V., Irace, A., Breglio, G., Spirito, P., Bricconi, A., Carta, R., Raffo, D., Merlin, L.

Année:

2006

Langue:

english

Fichier:

PDF, 3.10 MB

english, 2006

4

[IEEE 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Waikoloa, HI, USA (2014.6.15-2014.6.19)] 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Short-circuit robustness of SiC Power MOSFETs: Experimental analysis

Castellazzi, Alberto, Fayyaz, Asad, Yang, Li, Riccio, Michele, Irace, Andrea

Année:

2014

Langue:

english

Fichier:

PDF, 1.93 MB

english, 2014

5

Advertising and R&D: theory and evidence from France

Askenazy, Philippe, Breda, Thomas, Irac, Delphine

Journal:

Economics of Innovation and New Technology

Année:

2016

Langue:

english

Fichier:

PDF, 830 KB

english, 2016

6

A temperature-dependent SPICE model of SiC Power MOSFETs for within and out-of-SOA simulations

Riccio, Michele, d'Alessandro, Vincenzo, Romano, Gianpaolo, Maresca, Luca, Breglio, Giovanni, Irace, Andrea

Journal:

IEEE Transactions on Power Electronics

Année:

2017

Langue:

english

Fichier:

PDF, 1.54 MB

english, 2017

7

A Comprehensive Study on the Avalanche Breakdown Robustness of Silicon Carbide Power MOSFETs

Fayyaz, Asad, Romano, Gianpaolo, Urresti, Jesus, Riccio, Michele, Castellazzi, Alberto, Irace, Andrea, Wright, Nick

Journal:

Année:

2017

Langue:

english

Fichier:

PDF, 15.62 MB

english, 2017

8

Statistical Analysis of the Electrothermal Imbalances of Mismatched Parallel SiC Power MOSFETs

Borghese, Alessandro, Riccio, Michele, Fayyaz, Asad, Castellazzi, Alberto, Maresca, Luca, Breglio, Giovanni, Irace, Andrea

Journal:

IEEE Journal of Emerging and Selected Topics in Power Electronics

Année:

2019

Fichier:

PDF, 3.44 MB

2019

9

Italian Architecture from the Inside

Journal:

Architectural Design

Année:

2007

Langue:

english

Fichier:

PDF, 267 KB

english, 2007

10

A novel configuration for a wide-range high-power fiber-optic current sensor

A. Irace, G. Breglio, A. Luciano, L. Zeni, A. Cutolo

Journal:

European Transactions on Electrical Power

Année:

1997

Langue:

english

Fichier:

PDF, 482 KB

english, 1997

11

Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell

G. Breglio, A. Irace, E. Napoli, P. Spirito, K. Hamada, T. Nishijima, T. Ueta

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 778 KB

english, 2007

12

ANSYS based 3D electro-thermal simulations for the evaluation of power MOSFETs robustness

Stefano de Filippis, Vladimír Košel, Donald Dibra, Stefan Decker, Helmut Köck, Andrea Irace

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 878 KB

english, 2011

13

Influence of charge balance on the robustness of trench-based super junction diodes

A. Villamor-Baliarda, P. Vanmeerbeek, M. Riccio, V. d’Alessandro, A. Irace, J. Roig, D. Flores, P. Moens

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 1.03 MB

english, 2012

14

Physics of the Negative Resistance in the Avalanche $I{-}V$ Curve of Field Stop IGBTs: Collector Design Rules for Improved Ruggedness

Spirito, Paolo, Breglio, Giovanni, Irace, Andrea, Maresca, Luca, Napoli, Ettore, Riccio, Michele

Journal:

IEEE Transactions on Electron Devices

Année:

2014

Langue:

english

Fichier:

PDF, 2.44 MB

english, 2014

15

Automatic TCAD model calibration for multi-cellular Trench-IGBTs

Maresca, Luca, Breglio, Giovanni, Irace, Andrea

Journal:

Solid-State Electronics

Année:

2014

Langue:

english

Fichier:

PDF, 1.44 MB

english, 2014

16

[IEEE 2014 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2014.3.9-2014.3.13)] 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - An ultrafast IR thermography system for transient temperature detection on electronic devices

Romano, G., Riccio, M., De Falco, G., Maresca, L., Irace, A., Breglio, G.

Année:

2014

Langue:

english

Fichier:

PDF, 1.99 MB

english, 2014

17

[IEEE 2014 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM 2014) - Ischia, Italy (2014.6.18-2014.6.20)] 2014 International Symposium on Power Electronics, Electrical Drives, Automation and Motion - An effective parameters calibration technique for PSpice IGBT models application

Cavaiuolo, D., Riccio, M., De Falco, G., Romano, G., Irace, A., Breglio, G., Dapra, D., Merlin, L., Carta, R., Sanfilippo, C., Crudelini, F.

Année:

2014

Langue:

english

Fichier:

PDF, 591 KB

english, 2014

18

Competition, R&D, and the cost of innovation: evidence for France

Askenazy, P., Cahn, C., Irac, D.

Journal:

Oxford Economic Papers

Année:

2013

Langue:

english

Fichier:

PDF, 202 KB

english, 2013

19

Effect of the Collector Design on the IGBT Avalanche Ruggedness: A Comparative Analysis Between Punch-Through and Field-Stop Devices

Spirito, Paolo, Maresca, Luca, Riccio, Michele, Breglio, Giovanni, Irace, Andrea, Napoli, Ettore

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 1.58 MB

english, 2015

20

A robust electro-thermal IGBT SPICE model: Application to short-circuit protection circuit design

Cavaiuolo, D., Riccio, M., Maresca, L., Irace, A., Breglio, G., Daprà, D., Sanfilippo, C., Merlin, L.

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.16 MB

english, 2015

21

Reforming the "Bad" Quartos: Performance and Provenance of Six Shakespearean First Editions.

Shand, G. B., Irace, Kathleen O.

Journal:

Shakespeare Quarterly

Année:

1997

Langue:

english

Fichier:

PDF, 564 KB

english, 1997

22

A Comprehensive Study of the Short-Circuit Ruggedness of Silicon Carbide Power MOSFETs

Romano, Gianpaolo, Fayyaz, Asad, Riccio, Michele, Maresca, Luca, Breglio, Giovanni, Castellazzi, Alberto, Irace, Andrea

Journal:

IEEE Journal of Emerging and Selected Topics in Power Electronics

Année:

2016

Langue:

english

Fichier:

PDF, 7.18 MB

english, 2016

23

200V Fast Recovery Epitaxial Diode with superior ESD capability

Irace, A., Maresca, L., Mirone, P., Riccio, M., Breglio, G., Bellemo, L., Carta, R., Naretto, M., El Baradai, N., Para, I., Di Santo, N.

Journal:

Microelectronics Reliability

Année:

2016

Langue:

english

Fichier:

PDF, 2.11 MB

english, 2016

24

Embryology of congenital neck masses

Irace, Alexandria, Adil, Eelam

Journal:

Operative Techniques in Otolaryngology-Head and Neck Surgery

Année:

2017

Langue:

english

Fichier:

PDF, 962 KB

english, 2017

25

[IEEE 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) - Sapporo, Japan (2017.5.28-2017.6.1)] 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) - Influence of gate bias on the avalanche ruggedness of SiC power MOSFETs

Fayyaz, A., Castellazzi, A., Romano, G., Riccio, M., Irace, A., Urresti, J., Wright, N.

Année:

2017

Fichier:

PDF, 887 KB

2017

26

[IEEE 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Chicago, IL (2018.5.13-2018.5.17)] 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Temperature dependence of the on-state voltage drop in field-stop IGBTs

Maresca, L., Riccio, M., Breglio, G., Irace, A., Mirone, P., Sanfilippo, C., Merlin, L.

Année:

2018

Langue:

english

Fichier:

PDF, 966 KB

english, 2018

27

Investigation on the Self-Sustained Oscillation of Superjunction MOSFET Intrinsic Diode

Xue, Peng, Maresca, Luca, Riccio, Michele, Breglio, Giovanni, Irace, Andrea

Journal:

IEEE Transactions on Electron Devices

Année:

2018

Langue:

english

Fichier:

PDF, 2.69 MB

english, 2018

28

Novel Cathode Design to Improve the ESD Capability of 600 V Fast Recovery Epitaxial Diodes

Maresca, Luca, De Caro, Giuseppe, Romano, Gianpaolo, Riccio, Michele, Breglio, Giovanni, Irace, Andrea, Bellemo, Laura, Carta, Rossano, El Baradai, Nabil

Journal:

Année:

2018

Langue:

english

Fichier:

PDF, 8.77 MB

english, 2018

29

The First Quarto of Hamlet || Scene [10]

Shakespeare, William, Irace, Kathleen O.

Année:

1998

Langue:

english

Fichier:

PDF, 81 KB

english, 1998

30

The First Quarto of Hamlet || Scene [6]

Shakespeare, William, Irace, Kathleen O.

Année:

1998

Langue:

english

Fichier:

PDF, 128 KB

english, 1998

31

The First Quarto of Hamlet || Scene [4]

Shakespeare, William, Irace, Kathleen O.

Année:

1998

Langue:

english

Fichier:

PDF, 134 KB

english, 1998

32

The First Quarto of Hamlet || Scene [8]

Shakespeare, William, Irace, Kathleen O.

Année:

1998

Langue:

english

Fichier:

PDF, 100 KB

english, 1998

33

The First Quarto of Hamlet || Scene [5]

Shakespeare, William, Irace, Kathleen O.

Année:

1998

Langue:

english

Fichier:

PDF, 258 KB

english, 1998

34

The First Quarto of Hamlet || Scene [1]

Shakespeare, William, Irace, Kathleen O.

Année:

1998

Langue:

english

Fichier:

PDF, 226 KB

english, 1998

35

The First Quarto of Hamlet || Scene [12]

Shakespeare, William, Irace, Kathleen O.

Année:

1998

Langue:

english

Fichier:

PDF, 93 KB

english, 1998

36

The First Quarto of Hamlet || Scene [11]

Shakespeare, William, Irace, Kathleen O.

Année:

1998

Langue:

english

Fichier:

PDF, 204 KB

english, 1998

37

[IEEE 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Vienna, Austria (2020.9.13-2020.9.18)] 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) - SiC MOSFETs soft and hard failure modes: functional analysis and structural characterization

Richardeau, F., Boige, F., Castellazzi, A., Chazal, V., Fayyaz, A., Borghese, A., Irace,, Guibaud, G.

Année:

2020

Fichier:

PDF, 2.13 MB

2020

38

Oreacerebrosides: Bioactive Cerebrosides with a Triunsaturated Sphingoid Base from the Sea Star Oreaster reticulatus

Valeria Costantino, Caterina de Rosa, Ernesto Fattorusso, Concetta Imperatore, Alfonso Mangoni, Carlo Irace, Carmen Maffettone, Domenica Capasso, Livia Malorni, Rosanna Palumbo, Carlo Pedone

Journal:

European Journal of Organic Chemistry

Année:

2007

Langue:

english

Fichier:

PDF, 150 KB

english, 2007

39

Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation

A. Irace, G. Breglio, P. Spirito, R. Letor, S. Russo

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 878 KB

english, 2005

40

Detection of localized UIS failure on IGBTs with the aid of lock-in thermography

Breglio, G., Irace, A., Napoli, E., Riccio, M., Spirito, P., Hamada, K., Nishijima, T., Ueta, T.

Journal:

Microelectronics Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 549 KB

english, 2008

41

A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing

L. Rossi, M. Riccio, E. Napoli, A. Irace, G. Breglio, P. Spirito

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 1.25 MB

english, 2010

42

Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography

M. Riccio, L. Rossi, A. Irace, E. Napoli, G. Breglio, P. Spirito, R. Tagami, Y. Mizuno

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 937 KB

english, 2010

43

Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode

A. Irace, G. Breglio, P. Spirito, A. Bricconi, D. Raffo, L. Merlin

Journal:

Microelectronics Reliability

Année:

2006

Langue:

english

Fichier:

PDF, 4.10 MB

english, 2006

44

New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs

Andrea Irace, Giovanni Breglio, Paolo Spirito

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 364 KB

english, 2007

45

Measurement of thermal conductivity and diffusivity of single and multilayer membranes

Andrea Irace, Pasqualina M Sarro

Journal:

Sensors and Actuators A: Physical

Année:

1999

Langue:

english

Fichier:

PDF, 544 KB

english, 1999

46

Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology

M. Riccio, A. Pantellini, A. Irace, G. Breglio, A. Nanni, C. Lanzieri

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2011

47

Resonance frequency of locally heated cantilever beams

Iervolino, E., Riccio, M., Santagata, F., Wei, J., van Herwaarden, A.W., Irace, A., Breglio, G., Sarro, P.M.

Journal:

Sensors and Actuators A: Physical

Année:

2013

Langue:

english

Fichier:

PDF, 689 KB

english, 2013

48

Infrared Thermography application to functional and failure analysis of electron devices and circuits

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 1.05 MB

english, 2012

49

Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices

Stefano de Filippis, Helmut Köck, Michael Nelhiebel, Vladimír Košel, Stefan Decker, Michael Glavanovics, Andrea Irace

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 926 KB

english, 2012

50

3D electro-thermal simulations of wide area power devices operating in avalanche condition

M. Riccio, G. De Falco, L. Maresca, G. Breglio, E. Napoli, A. Irace, Y. Iwahashi, P. Spirito

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 926 KB

english, 2012