Volume 60; Issue 6

IEEE Transactions on Electron Devices

Volume 60; Issue 6

1

Gate All Around MOSFET With Vacuum Gate Dielectric for Improved Hot Carrier Reliability and RF Performance

Gautam, Rajni, Saxena, Manoj, Gupta, Radhey Shyam, Gupta, Mridula

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2013

2

Thermoelectric Performance of a Single-Layer Graphene Sheet for Energy Harvesting

Verma, Rekha, Bhattacharya, Sitangshu, Mahapatra, Santanu

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 993 KB

english, 2013

3

Small-Signal Capacitance and Current Parameter Modeling in Large-Scale High-Frequency Graphene Field-Effect Transistors

Zebrev, Gennady I., Tselykovskiy, Alexander A., Batmanova, Daria K., Melnik, Evgeny V.

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 818 KB

english, 2013

4

Comparison of ZnO-Based JFET, MESFET, and MISFET

Klupfel, Fabian Johannes, Schein, Friedrich-Leonhard, Lorenz, Michael, Frenzel, Heiko, von Wenckstern, Holger, Grundmann, Marius

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.18 MB

english, 2013

5

Thermal Parameter Extraction Method for Light-Emitting Diode (LED) Systems

Tao, Xuehui, Zhang, Dongli

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1000 KB

english, 2013

6

Transient Off-Current in Junctionless FETs

Barbut, Lucian, Jazaeri, Farzan, Bouvet, Didier, Sallese, Jean-Michel

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 539 KB

english, 2013

7

An Effective Capacitance Model for 28-nm and Beyond Copper Interconnect

Xu, Yajun, Bai, Fanfei, Liu, Wuping, Xie, Chaoying

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 863 KB

english, 2013

8

Compact Model for Carbon Nanotube Field-Effect Transistors Including Nonidealities and Calibrated With Experimental Data Down to 9-nm Gate Length

Luo, Jieying, Wei, Lan, Lee, Chi-Shuen, Franklin, Aaron D., Guan, Ximeng, Pop, Eric, Antoniadis, Dimitri A., Wong, H.-S. Philip

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 967 KB

english, 2013

9

Fast-Switching Printed Organic Electrochemical Transistors Including Electronic Vias Through Plastic and Paper Substrates

Kawahara, Jun, Ersman, Peter Andersson, Katoh, Kazuya, Berggren, Magnus

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 334 KB

english, 2013

10

Thermometry of AlGaN/GaN HEMTs Using Multispectral Raman Features

Choi, Sukwon, Heller, Eric R., Dorsey, Donald, Vetury, Ramakrishna, Graham, Samuel

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.24 MB

english, 2013

11

Influence of Dopants on the Thermal Conductance of GaN–Sapphire Interface

Zheng, H., Jagannadham, Kasichainula

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 259 KB

english, 2013

12

Low-Interface-Trap-Density and High-Breakdown-Electric-Field SiN Films on GaN Formed by Plasma Pretreatment Using Microwave-Excited Plasma-Enhanced Chemical Vapor Deposition

Watanabe, Tadashi, Teramoto, Akinobu, Nakao, Yukihisa, Sugawa, Shigetoshi, Ohmi, Tadahiro

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.53 MB

english, 2013

13

Surface-Roughness-Limited Mean Free Path in Silicon Nanowire Field Effect Transistors

Jung, Hyo-Eun, Shin, Mincheol

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.31 MB

english, 2013

14

Hot Carrier Injection Effects in the Ultrashallow Body SONOS Gate Power MOSFET

Zhou, Xianda, Feng, Hao, Sin, Johnny K. O.

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.24 MB

english, 2013

15

Split-Gate-Enhanced Power UMOSFET With Soft Reverse Recovery

Wang, Ying, Jiao, Wen-Li, Hu, Hai-Fan, Liu, Yun-Tao, Gao, Jing

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.34 MB

english, 2013

16

Single-Event Burnout Hardening of Power UMOSFETs With Optimized Structure

Wang, Ying, Zhang, Yue, Wang, Li-Guo, Yu, Chenghao

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 786 KB

english, 2013

17

Ferroelectric-Assisted Dual-Switching Speed DRAM–Flash Hybrid Memory

Rajwade, Shantanu R., Naoi, Taro A., Auluck, Kshitij, Jayant, Krishna, Van Dover, Robert Bruce, Kan, Edwin C.

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 469 KB

english, 2013

18

Device and Circuit Performance Estimation of Junctionless Bulk FinFETs

Han, Ming-Hung, Chang, Chun-Yen, Chen, Hung-Bin, Cheng, Ya-Chi, Wu, Yung-Chun

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 924 KB

english, 2013

19

Unified Endurance Degradation Model of Floating Gate NAND Flash Memory

Fayrushin, Albert, Lee, Chang-Hyun, Park, Youngwoo, Choi, Jeong-Hyuk, Chung, Chilhee

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.30 MB

english, 2013

20

Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET

Fan, Ming-Long, Hu, Vita Pi-Ho, Chen, Yin-Nein, Su, Pin, Chuang, Ching-Te

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.78 MB

english, 2013

21

Measurements and Simulations of Low Dark Count Rate Single Photon Avalanche Diode Device in a Low Voltage 180-nm CMOS Image Sensor Technology

Leitner, Tomer, Feiningstein, Amos, Turchetta, Renato, Coath, Rebecca, Chick, Steven, Visokolov, Gil, Savuskan, Vitali, Javitt, Michael, Gal, Lior, Brouk, Igor, Bar-Lev, Sharon, Nemirovsky, Yael

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 819 KB

english, 2013

22

Near-Infrared Photodetectors in Evaporated Ge: Characterization and TCAD Simulations

Sorianello, Vito, De Iacovo, Andrea, Colace, Lorenzo, Assanto, Gaetano

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 702 KB

english, 2013

23

Accelerated Stress Test Assessment of Through-Silicon Via Using RF Signals

Okoro, Chukwudi, Kabos, Pavel, Obrzut, Jan, Hummler, Klaus, Obeng, Yaw S.

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 984 KB

english, 2013

24

Wafer-Level Integration of High-Quality Bulk Piezoelectric Ceramics on Silicon

Aktakka, Ethem Erkan, Peterson, Rebecca L., Najafi, Khalil

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.49 MB

english, 2013

25

Organic Complementary Logic Circuits and Volatile Memories Integrated on Plastic Foils

Guerin, Mathieu, Bergeret, Emmanuel, Benevent, Evanegline, Daami, Anis, Pannier, Philippe, Coppard, Romain

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2013

26

Transconductance Linearity Analysis of 1-D, Nanowire FETs in the Quantum Capacitance Limit

Razavieh, Ali, Janes, David B., Appenzeller, Joerg

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 852 KB

english, 2013

27

Dislocation Scattering in ZnMgO/ZnO Heterostructures

Sang, Ling, Yang, Shao Yan, Liu, Gui Peng, Zhao, Gui Juan, Liu, Chang Bo, Gu, Cheng Yan, Wei, Hong Yuan, Liu, Xiang Lin, Zhu, Qin Sheng, Wang, Zhan Guo

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 281 KB

english, 2013

28

Germanium Multiple-Gate Field-Effect Transistors Formed on Germanium-on-Insulator Substrate

Liu, Bin, Gong, Xiao, Zhan, Chunlei, Han, Genquan, Chin, Hock-Chun, Ling, Moh-Lung, Li, Jie, Liu, Yongdong, Hu, Jiangtao, Daval, Nicolas, Veytizou, Christelle, Delprat, Daniel, Nguyen, Bich-Yen, Yeo,

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 2.07 MB

english, 2013

29

Influence by Layer Structure on the Output EL of CMOS Compatible Silicon-Based Light Emitters

Gonzalez-Fernandez, Alfredo Abelardo, Juvert, Joan, Aceves-Mijares, Mariano, Llobera, Andreu, Dominguez, Carlos

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 606 KB

english, 2013

30

Thermal Modeling of Resistive Switching Devices

Ramu, Ashok T., Strukov, Dmitri B.

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 351 KB

english, 2013

31

Transparent Junctionless Electric-Double-Layer Transistors Gated by a Reinforced Chitosan-Based Biopolymer Electrolyte

Jiang, Jie, Wan, Qing, Zhang, Qing

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 841 KB

english, 2013

32

Characterization and Modeling of 4H-SiC Lateral MOSFETs for Integrated Circuit Design

Mudholkar, Mihir, Mantooth, H. Alan

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 2.40 MB

english, 2013

33

Time and Frequency Domain Characterization of Transistor Self-Heating

Makovejev, Sergej, Olsen, Sarah H., Kilchytska, Valeriya, Raskin, Jean-Pierre

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 541 KB

english, 2013

34

Schottky Barrier Controlled Conduction in Poly-Si TFTs With Metal Source and Drain

Chen, Jie, Wang, Mingxiang, Zhang, Dongli, Lv, Ping, Wong, Man

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2013

35

Frequency and Voltage Dependence of the Capacitance of MIS Structures Fabricated With Polymeric Materials

Estrada, Magali, Ulloa, Fernando, Avila, Mario, Sanchez, Jose, Cerdeira, Antonio, Castro-Carranza, Alejandra, Iniguez, Benjamin, Marsal, Lluis F., Pallares, Josep

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 755 KB

english, 2013

36

Comprehensive Analysis of Short-Channel Effects in Ultrathin SOI MOSFETs

Xie, Qian, Lee, Chia-Jung, Xu, Jun, Wann, Clement, Sun, Jack Y.-C., Taur, Yuan

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 2.48 MB

english, 2013

37

Modeling and Simulation of Organic Photodetectors for Low Light Intensity Applications

Popescu, Bogdan Vlad, Popescu, Dan Horia, Lugli, Paolo, Locci, Simone, Arca, Francesco, Tedde, Sandro Francesco, Sramek, Maria, Hayden, Oliver

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.04 MB

english, 2013

38

Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

Zhao, Shuyun, Meng, Zhiguo, Zhou, Wei, Ho, Jacob, Wong, Man, Kwok, Hoi-Sing

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 1.78 MB

english, 2013

39

Call for papers: Advanced manufactring of wide band gap (WBG) semiconductor products

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Fichier:

PDF, 256 KB

2013

40

Table of contents

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 145 KB

english, 2013

41

IEEE Transactions on Electron Devices publication information

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 150 KB

english, 2013

42

IEEE Transactions on Electron Devices information for authors

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Langue:

english

Fichier:

PDF, 103 KB

english, 2013

43

[Blank page - back cover]

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Fichier:

PDF, 6 KB

2013

44

Call for Papers: 44th IEEE Semiconductor Interface Specialists Conference - Submission Deadline: July 22, 2013

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Fichier:

PDF, 156 KB

2013

45

First call for papers: IEEE International Integrated Reliability Workshop

Journal:

IEEE Transactions on Electron Devices

Année:

2013

Fichier:

PDF, 847 KB

2013