Volume 27; Issue 3

Ultramicroscopy

Volume 27; Issue 3
1

Charging effect on the HRTEM imaging of small MgO crystals

Takayoshi Tanji, Hideki Masaoka, Jhota Ito, Keiji Yada, John M. Cowley
Journal:
Ultramicroscopy
Année:
1989
Langue:
english
Fichier:
PDF, 7.38 MB
english, 1989
2

Errors and correction term for holz line simulations

Y.P. Lin, D.M. Bird, R. Vincent
Journal:
Ultramicroscopy
Année:
1989
Langue:
english
Fichier:
PDF, 417 KB
english, 1989
3

Substrate properties affect the mass loss rate in collodion at liquid helium temperature

M.K. Lamvik, S.D. Davilla, L.L. Klatt
Journal:
Ultramicroscopy
Année:
1989
Langue:
english
Fichier:
PDF, 571 KB
english, 1989
4

Autotuning of a TEM using minimum electron dose

A.J. Koster, W.J. de Ruijter, A. Van Den Bos, K.D. Van Der Mast
Journal:
Ultramicroscopy
Année:
1989
Langue:
english
Fichier:
PDF, 2.28 MB
english, 1989
6

Spatial rotational alignment of identical particles in the case of (almost) coaxial projections

M.S. Gelfand, A.B. Goncharov
Journal:
Ultramicroscopy
Année:
1989
Langue:
english
Fichier:
PDF, 318 KB
english, 1989
8

Observations of surface-channelling phenomena with a stem instrument

J.M. Cowley
Journal:
Ultramicroscopy
Année:
1989
Langue:
english
Fichier:
PDF, 3.19 MB
english, 1989
9

A high-yield method for the preparation of cleaved wedge specimens through semiconductor interfaces

R.J. Graham
Journal:
Ultramicroscopy
Année:
1989
Langue:
english
Fichier:
PDF, 149 KB
english, 1989
10

Announcement

Journal:
Ultramicroscopy
Année:
1989
Fichier:
PDF, 16 KB
1989
11

Erratum

Journal:
Ultramicroscopy
Année:
1989
Fichier:
PDF, 23 KB
1989