Volume 148; Issue 2

Thin Solid Films

Volume 148; Issue 2
2

Depth profiles of the optical properties of buried oxides (SIMOX) by ellipsometry

Année:
1987
Langue:
english
Fichier:
PDF, 428 KB
english, 1987
3

Determination of the refractive index profile of arsenic-implanted GaP by ellipsometry

Année:
1987
Langue:
english
Fichier:
PDF, 457 KB
english, 1987
4

Optical properties of AgGaSe2 thin films

Année:
1987
Langue:
english
Fichier:
PDF, 309 KB
english, 1987
5

Degradation of metal/oxide/semiconductor structures by Fowler-Nordheim tunnelling injection

Année:
1987
Langue:
english
Fichier:
PDF, 748 KB
english, 1987
6

Grain boundary interdiffusion in Cd/Te thin film couples

Année:
1987
Langue:
english
Fichier:
PDF, 335 KB
english, 1987
7

Limits to the hardness testing of films thinner than 1 μm

Année:
1987
Langue:
english
Fichier:
PDF, 509 KB
english, 1987
8

X-ray diffraction studies of Bi2O3 films prepared by reactive and activated reactive evaporation

Année:
1987
Langue:
english
Fichier:
PDF, 382 KB
english, 1987
9

Electrodeposition and characterization of cuprous oxide

Année:
1987
Langue:
english
Fichier:
PDF, 601 KB
english, 1987
10

Thin film transistors with Er2O3 gate insulators

Année:
1987
Langue:
english
Fichier:
PDF, 232 KB
english, 1987
11

Characterization of Ni-Cr thin films by X-ray analysis

Année:
1987
Langue:
english
Fichier:
PDF, 534 KB
english, 1987
13

Optical properties of tungsten bronze surfaces

Année:
1987
Langue:
english
Fichier:
PDF, 127 KB
english, 1987