Volume 53; Issue 1

Technometrics

Volume 53; Issue 1
1

Statistical Shape Analysis of Experiments for Manufacturing Processes

Castillo, Enrique, Colosimo, Bianca M.
Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 475 KB
english, 2011
2

A Multivariate Sign EWMA Control Chart

Zou, Changliang, Tsung, Fugee
Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 512 KB
english, 2011
3

Efficient Designs With Minimal Aliasing

Jones, Bradley, Nachtsheim, Christopher J.
Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 225 KB
english, 2011
4

Robust Ridge Regression for High-Dimensional Data

Maronna, Ricardo A.
Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 266 KB
english, 2011
5

Nearly-Isotonic Regression

Tibshirani, Ryan J., Hoefling, Holger, Tibshirani, Robert
Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 285 KB
english, 2011
6

Errata

Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 94 KB
english, 2011
8

Book Reviews

Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 163 KB
english, 2011
9

Statistical Emulation of Large Linear Dynamic Models

Young, P. C., Ratto, M.
Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 712 KB
english, 2011
10

Efficient MCMC Schemes for Computationally Expensive Posterior Distributions

Fielding, Mark, Nott, David J., Liong, Shie-Yui
Journal:
Technometrics
Année:
2011
Langue:
english
Fichier:
PDF, 1.10 MB
english, 2011