Volume 11; Issue 2

Asian Journal of Control

Volume 11; Issue 2
2

Author's Reply

Année:
2009
Langue:
english
Fichier:
PDF, 62 KB
english, 2009
3

Special Issue on “Advanced Control Methods for Scanning Probe Microscopy”

Année:
2009
Langue:
english
Fichier:
PDF, 95 KB
english, 2009
4

Industrial perspectives of AFM control

Année:
2009
Langue:
english
Fichier:
PDF, 343 KB
english, 2009
7

High-speed serial-kinematic SPM scanner: design and drive considerations

Année:
2009
Langue:
english
Fichier:
PDF, 613 KB
english, 2009
8

Rapid AFM imaging of large soft samples in liquid with small forces

Année:
2009
Langue:
english
Fichier:
PDF, 439 KB
english, 2009
9

Image-based hysteresis modeling and compensation for an AFM piezo-scanner

Année:
2009
Langue:
english
Fichier:
PDF, 402 KB
english, 2009
10

A comparison of control architectures for atomic force microscopes

Année:
2009
Langue:
english
Fichier:
PDF, 178 KB
english, 2009
11

Creep and hysteresis compensation for nanomanipulation using atomic force microscope

Année:
2009
Langue:
english
Fichier:
PDF, 138 KB
english, 2009
12

Semi-automatic tuning of PID gains for atomic force microscopes

Année:
2009
Langue:
english
Fichier:
PDF, 303 KB
english, 2009
13

Force/motion sliding mode control of three typical mechanisms

Année:
2009
Langue:
english
Fichier:
PDF, 328 KB
english, 2009
15

A new potential field method for mobile robot path planning in the dynamic environments

Année:
2009
Langue:
english
Fichier:
PDF, 239 KB
english, 2009
16

On stability and stabilizability of positive delay systems

Année:
2009
Langue:
english
Fichier:
PDF, 216 KB
english, 2009