Volume 76; Issue 11

Proceedings of the IEEE

Volume 76; Issue 11
1

Radiation effects on microelectronics in space

Srour, J.R., McGarrity, J.M.
Journal:
Proceedings of the IEEE
Année:
1988
Langue:
english
Fichier:
PDF, 2.85 MB
english, 1988
3

Spacecraft electronics design for radiation tolerance

Rasmussen, R.D.
Journal:
Proceedings of the IEEE
Année:
1988
Langue:
english
Fichier:
PDF, 1.27 MB
english, 1988
4

The space radiation environment for electronics

Stassinopoulos, E.G., Raymond, J.P.
Journal:
Proceedings of the IEEE
Année:
1988
Langue:
english
Fichier:
PDF, 1.65 MB
english, 1988
5

Radiation testing of semiconductor devices for space electronics

Pease, R.L., Johnston, A.H., Azarewicz, J.L.
Journal:
Proceedings of the IEEE
Année:
1988
Langue:
english
Fichier:
PDF, 1.85 MB
english, 1988
6

Capacitance of semiconductor p-n junction space-charge layers: an overview

Liou, J.J., Lindholm, F.A.
Journal:
Proceedings of the IEEE
Année:
1988
Langue:
english
Fichier:
PDF, 1.43 MB
english, 1988
7

Virtual address cache with no reverse address buffering

Lopriore, L.
Journal:
Proceedings of the IEEE
Année:
1988
Langue:
english
Fichier:
PDF, 305 KB
english, 1988
8

Comments on `The measurement of the properties of materials' by M.N. Afsar et al

Zalt'sman, E.B.
Journal:
Proceedings of the IEEE
Année:
1988
Langue:
english
Fichier:
PDF, 87 KB
english, 1988