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Volume 16; Issue 3

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Nanotechnology
Volume 16; Issue 3

Nanotechnology

Volume 16; Issue 3

1

Investigating atomic details of the CaF2(111) surface with a qPlus sensor

Giessibl, Franz J, Reichling, Michael

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 2.30 MB

english, 2005

2

Molecular-scale investigations of semi-insulating polymer single crystals by noncontact atomic force microscopy

Ichii, Takashi, Kawabata, Hiroshi, Fukuma, Takeshi, Kobayashi, Kei, Yamada, Hirofumi, Matsushige, Kazumi

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 522 KB

english, 2005

3

FM demodulated Kelvin probe force microscopy for surface photovoltage tracking

Loppacher, Christian, Zerweck, Ulrich, Teich, Sebastian, Beyreuther, Elke, Otto, Tobias, Grafström, Stefan, Eng, Lukas M

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 775 KB

english, 2005

4

Structural features of CeO 2 (111) revealed by dynamic SFM

Gritschneder, S, Namai, Y, Iwasawa, Y, Reichling, M

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 2.82 MB

english, 2005

5

Quantitative measurement of solvation shells using frequency modulated atomic force microscopy

Uchihashi, T, Higgins, M, Nakayama, Y, Sader, J E, Jarvis, S P

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 231 KB

english, 2005

6

Dynamic force spectroscopy using the constant-excitation and constant-amplitude modes

Schirmeisen, A, Hölscher, H, Anczykowski, B, Weiner, D, Schäfer, M M, Fuchs, H

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 330 KB

english, 2005

7

Frequency modulation atomic force microscopy: a dynamic measurement technique for biological systems

Higgins, Michael J, Riener, Christian K, Uchihashi, Takayuki, Sader, John E, McKendry, Rachel, Jarvis, Suzanne P

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 384 KB

english, 2005

8

Topography of anatase TiO 2 film synthesized on LaAlO 3 (001)

Sasahara, Akira, Droubay, Timothy C, Chambers, Scott A, Uetsuka, Hiroshi, Onishi, Hiroshi

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 636 KB

english, 2005

9

Analysis of mechanical properties of single wall carbon nanotubes fixed at a tip apex by atomic force microscopy

Dietzel, D, Faucher, Marc, Iaia, Antonio, Aimé, J P, Marsaudon, S, Bonnot, A M, Bouchiat, V, Couturier, G

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 530 KB

english, 2005

10

A universal relation in NC-AFM, STM, and atom manipulation

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 443 KB

english, 2005

11

Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy

Oyabu, Noriaki, Sugimoto, Yoshiaki, Abe, Masayuki, Custance, Óscar, Morita, Seizo

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 1.61 MB

english, 2005

12

Dynamic EFM spectroscopy studies on electric force gradients of IrO 2 nanorod arrays

Chiang, Daniel (Ching-Shih), Lei, Philip Zifeng, Zhang, Fengyan, Barrowcliff, Robert

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 720 KB

english, 2005

13

NC-AFM 2004: Proceedings of the 7th International Conference on Non-contact Atomic Force Microscopy

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 67 KB

english, 2005