Volume 62

MRS Proceedings

Volume 62
4

High Resolution Microanalysis of Interfaces

Garratt-Reed, Anthony J.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 402 KB
english, 1985
5

Some Advantages of EDS Analysis in a 400 KV Electron Microscope

Suzuki, S., Honda, T., Bando, Y.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 1.24 MB
english, 1985
6

Electron Energy Loss Fine Structure of Carbides and Nitrides

Disko, Mark M.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 526 KB
english, 1985
8

Convergent-Beam Diffraction in the Characterization of Crystalline Phases

Eades, J. A., Kaufman, M. J., Fraser, H. L.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.63 MB
english, 1985
9

Cold Alchemi: Impurity Atom Site Location and the Temperature Dependance of Dechannelling

Spence, J. C. H., Graham, R. J., Shindo, D.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 542 KB
english, 1985
10

Role of the Critical Voltage Effect in Materials Characterization

Fisher, Robert M.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 363 KB
english, 1985
11

Diffusion Measurements by Analytical Electron Microscopy

Romig, A. D.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 841 KB
english, 1985
12

Characterization of Precipitates Decorating Stacking Faults in Single Crystal Silicon

Ryoo, K., Drosd, R., Wood, W. E.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.85 MB
english, 1985
14

Determination of Phase Diagrams by AEM

Ayer, Raghavan
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 585 KB
english, 1985
15

AEM Microanalysis of Phase Equilibria in Ni3Al Intermetallic Alloys Containing Iron

Bramfitt, Bruce L., Michael, Joseph R.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 1.70 MB
english, 1985
16

Measurement of Equilibrium and Nonequilibrium Segregation by X-Ray Microanalysis

Kenik, Edward A.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 3.03 MB
english, 1985
17

The Use of Symmetry in the TEM Analysts of Precipitate Morphologies

Dahmen, U., Westhacott, K. H.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 4.54 MB
english, 1985
18

High Resolution Moire Imaging of Small Precipitates

Kesternich, W.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 4.88 MB
english, 1985
19

Contributions of Electron Microscopy to the Understanding of Reactions on Compound Semiconductor Surfaces

Sands, T.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 1.75 MB
english, 1985
20

A Quasicrystalline Decagonal Phase in Al-Fe-Ce

Angers, L. H., Marks, L. D., Weertman, J. R., Fine, M. E.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.86 MB
english, 1985
21

Quantitative Microanalysis of Fine Precipitates in Microalloyed Steels

Michael, Joseph R.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.41 MB
english, 1985
23

Crystalline-to-Amorphous Transitions in Ti-Ni Alloys

Pelton, R., Moine, P., Noack, M. A., Sinclair, R.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.02 MB
english, 1985
24

An In-Situ Study of Velocity/Driving Force Relations for Interfacial Migration

park, Woonsup, Allen, Samuel M.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 1.72 MB
english, 1985
26

Application of Hrem in Studying Amorphisation of Intermetallic Compounds

Luzzi, D. E., Mori, H., Fujita, H., Meshii, M.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.32 MB
english, 1985
27

Compositional Profiling of Rapidly Solidified Cellular Structures

Mackey, Terrence M., Kelly, Thomas F.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.72 MB
english, 1985
29

Commensuration and Discommensuration in the Ag-Mg Alloys

Fujino, Y., Sato, H., Otsuka, N.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 1.29 MB
english, 1985
30

High Resolution Electron Microscopy of Triply Incommensurate Phase of 2H-TaSe2

Onozuka, Takashi, Otsuka, Nobuo, Sato, Hiroshi
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.93 MB
english, 1985
31

Detection and Imaging of Supported Catalyst Particles

Treacy, Michael M. J.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 5.74 MB
english, 1985
32

The Core Structure of Dislocations in GaAs

De Cooman, B. C., Kuesters, K.-H., Carter, C. B.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 3.93 MB
english, 1985
34

High Resolution Imaging of As-Grown Sapphire Surfaces

Hsu, Tung, Nutt, S. R.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 4.80 MB
english, 1985
35

Electron Microscopy of Ion Deposited Thin Films of the Oxides of Titanium

Harker, A. B., Howitt, D. G., Hood, P. J., Kobrin, P.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 4.26 MB
english, 1985
36

High Spatial Resolution Microanalysis of Catalyst Particles

Lyman, C. E.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 3.75 MB
english, 1985
37

Characterization of Reactively Sputtered Titanium Carbide Films by Analytical Electron Microscopy

Tafto, J., Rajeswaran, G., Saulys, T.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 656 KB
english, 1985
38

Grain-Boundary, Glassy-Phase Identification and Possible Artifacts

Simpson, Y. Kouh, Carter, C. B., Sklad, P., Bentley, J.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.58 MB
english, 1985
39

Microstructural Changes in Deformed Silicon Nitride and Silicon Carbide

Tighe, Nancy J.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 5.67 MB
english, 1985
40

Origin of Grown-in Dislocations in III-V Compound Semiconductor Epitaxial Layers

Nakahara, S., Chu, S. N. G.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 1.35 MB
english, 1985
41

TEM and SEM Studies of MOCVD-Grown GaP on Si

Ai-Jassim, M. M., Olson, J. M., Jones, K. M.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 3.79 MB
english, 1985
44

Application of Analytical Electron Microscopy to Ion Implantation and Near Surface Microstructures

Sklad, P. S.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 3.84 MB
english, 1985
45

TEM Studies of Low Energy Argon and Iodine Ion Milling Phenomena in Compound Semiconductors

Cullis, A. G., Chew, N. G., Hutchison, J. L.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 3.34 MB
english, 1985
46

Defect and Microstructural Analyses in Ferromagnetic Material

Horton, L. L.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 3.18 MB
english, 1985
47

Identification of Growth Induced Planar Defects in Silicon

Strunk, H. P., Kessler, A., Bauser, E.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 1.80 MB
english, 1985
48

Microstructure of Rapidly Solidified Al-Si Exhibiting Enhanced Superconducting Properties

Noack, M. A., Drehman, A. J., Pelton, A. R.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 2.23 MB
english, 1985
49

TEM Studies of Precipitate Growth at the Atomic Level

Howe, J. M., Gronsky, R.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 5.91 MB
english, 1985
50

EDX and EELS Analysis of Precipitates in HSLA Steels

Chen, Z., Loretio, M. H., Cochrane, R.
Journal:
MRS Proceedings
Année:
1985
Langue:
english
Fichier:
PDF, 1.77 MB
english, 1985