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Volume 406
Main
MRS Proceedings
Volume 406
MRS Proceedings
Volume 406
1
Origin of the 1.3 eV Transition in InP/InAlAs/InP Heterostructure
Benyattou, T.
,
Garcia-Perez, M. A.
,
Moneger, S.
,
Guillot, G
,
,
Caneau, C.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 294 KB
Vos balises:
english, 1995
2
Single-Photon Ionization, In Situ Optical Diagnostic Of Molecular Beam Epitaxial Growth Of GaAs
Ott, Adina K.
,
Casey, Sean M.
,
Alstrin, April L.
,
Leone, Stephen R.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 345 KB
Vos balises:
english, 1995
3
Temperature Measurements Using In Thermocouple In The Mocvd Rotating Disk Reactors
Gurary, A. I.
,
Stall, R. A.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 246 KB
Vos balises:
english, 1995
4
Quantitative Photoreflectance Experiments on Indium Phosphide Surfaces and Structures
Hildebrandt, S.
,
Schreiber, J.
,
Kuzmenko, R.
,
Gansha, A.
,
Kircher, W.
,
Höring, L.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 436 KB
Vos balises:
english, 1995
5
Three-Dimensional Active Gratings for Light Emission Control
Romanov, S. G.
,
Fokin, A.
,
Butko, V.
,
Johnson, N. P.
,
Torres, C. M. Sotomayor
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 424 KB
Vos balises:
english, 1995
6
Electron Density Effects in the Modulation Spectroscopy of Strained and Lattice-Matched InGaAs/InAlAs/InP HEMTs.
Dimoulas, A.
,
Davidow, J.
,
Giapis, K. P.
,
Georgakilas, A.
,
Halkias, G.
,
Kornelios, N.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 347 KB
Vos balises:
english, 1995
7
Monitoring Of Direct Reactions During Etching Of Silicon
Giapis, K. P.
,
Minton, T. K.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 401 KB
Vos balises:
english, 1995
8
Steplike Lineshape of Low Temperature Photoreflectance Spectra of InAlAs
Baltagi, Y.
,
Bearzi, E.
,
Bru-Chevallier, C.
,
Benyattou, T.
,
Guillot, G.
,
Harmand, J. C.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 367 KB
Vos balises:
english, 1995
9
Determining Thin Film Density by Energy-Dispersive X-Ray Reflectivity: Application to a Spin-On-Glass Dielectric
Wallace, W. E.
,
Wu, W. L.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 349 KB
Vos balises:
english, 1995
10
Precision of Non-invasive Temperature Measurement by Diffuse Reflectance Spectroscopy
Wang, Zhongze
,
Kwan, Siu L.
,
Pearsall, T. P.
,
Booth, James
,
Beard, Barrett T.
,
Johnson, Shane R.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 312 KB
Vos balises:
english, 1995
11
Optical-based Flux Monitoring of Atomic Antimony Sources for Molecular Beam Epitaxy
Brewer, P. D.
,
Killeen, K. P.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 375 KB
Vos balises:
english, 1995
12
In-Situ Monitoring Of Mocvd Grown Inall_ As/Gaas Epitaxial Layers By Two Laser Beams Reflectometry
Baek, Jong-Hyeob
,
Lee, Bun
,
Choi, Sung Woo
,
Lee, Jin Hong
,
Lee, El-Hang
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 317 KB
Vos balises:
english, 1995
13
Influence Of Growth Parameters On Interface Broadening In Mbe-Grown Interfaces: A Non Destructive Study By Magneto-Optics
Grieshaber, W.
,
Haury, A.
,
Cibert, J.
,
d'Aubigné, Y. Merle
,
Wasiela, A.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 345 KB
Vos balises:
english, 1995
14
Real-time Optical Monitoring of GaxIn1−xP/GaP Heterostructures on Silicon
Dietz, N.
,
Rossow, U.
,
Aspnes, D. E.
,
Sukidi, N.
,
Bachmann, K. J.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 306 KB
Vos balises:
english, 1995
15
Real-Time Composition And Thickness Control Techniques In A Metalorganic Chemical Vapor Deposition Process
Gaffneyt, M. S.
,
Reavesl, C. M.
,
Holmes, A. L
,
Smith, R. S.
,
DenBaars, S. P.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 373 KB
Vos balises:
english, 1995
16
Evaluation Of Reaction Dynamics Of Film Depositions In Plasma Cvds By Using A Remote Plasma Cvd System
Wickramanayaka, S.
,
Kitamura, K.
,
Nakanishi, Y.
,
Hatanaka, Y.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 321 KB
Vos balises:
english, 1995
17
Diagnostics And Control Of High-Density Etching Plasmas
Sugai, H.
,
Nakamura, K.
,
Ahn, T. H.
,
Nakamur, M.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.83 MB
Vos balises:
english, 1995
18
Real-Time Monitoring Of GaAs(100) Etching By Surface Photoabsorption
Eng, Joseph
,
Fang, Hongbin
,
Su, Chaochin
,
Vemuri, Sujata
,
Herman, Irving P.
,
Bent, Brian E.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 399 KB
Vos balises:
english, 1995
19
Diagnostic Techniques For Polycrystalline Thin Film Growth
Cheng, Kuan-Lun
,
Cheng, Huang-Chung
,
Yew, Tri-Rung
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 677 KB
Vos balises:
english, 1995
20
Light Scattering Measurement Of Surface Topography During Formation Of Titanium Silicide.
Lavoie, C.
,
Cabral, C.
,
Clevenger, L. A.
,
Harper, J. M. E.
,
Jordan-Sweet, J.
,
Saenger, K. L.
,
Doany., F.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 2.52 MB
Vos balises:
english, 1995
21
Characterization of Materials and Devices by Near-Field Scanning Optical Microscopy
Goldberg, B. B.
,
Ghaemi, H. F.
,
Ünlü, M. S.
,
Herzog, W. D.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.26 MB
Vos balises:
english, 1995
22
Near Field Scanning Optical Microscopy and Spectroscopy of Electronic Materials and Structures
Duncan, W. M.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.49 MB
Vos balises:
english, 1995
23
Imaging of Silicon Carrier Dynamics with Near-Field Scanning Optical Microscopy
Rosa, A. H. La
,
Yakobson, B. I.
,
Hallen, H. D.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 2.56 MB
Vos balises:
english, 1995
24
Afm/Tem Investigation of Low Temperature Polycrystalline Silicon Grown by ECR-CVD
Hsiao, H. L.
,
Wang, K. C.
,
Cheng, L. W.
,
Yang, A. B.
,
Yew, T. R.
,
Hwang, H. L.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 339 KB
Vos balises:
english, 1995
25
Afm Probe Tip and Image Reconstruction from Noisy Measurements
Fischer, H.
,
Nittmann, J.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 274 KB
Vos balises:
english, 1995
26
AFM Analysis of ECR Dry-Etched Ingap, Alinp and Algap
Ren, F.
,
Hobson, W. S.
,
Lothian, J. R.
,
Lopata, J.
,
Caballero, J. A.
,
Lee, J. W.
,
Pearton, S. J.
,
Cole, M. W.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 277 KB
Vos balises:
english, 1995
27
Nano-scale Imaging of Corrosion: Application of Scanning Polarization Force Microscopy
Dai, Qing
,
Hu, Jun
,
Freedman, Andrew
,
Robinson, Gary N.
,
Salmeron, Miquel
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.07 MB
Vos balises:
english, 1995
28
Single-Crystal Fine-Positioning Devices for Scanned-Probe Microscopies
Kleiman, R. N.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 489 KB
Vos balises:
english, 1995
29
Double Modulation and Selective Excitation Photoreflectance for Characterizing Highly Luminescent Semiconductor Structures and Samples with Poor Surface Morphology
Amirtharaj, P. M.
,
Chandler-Horowitz, D.
,
Bour, D. P.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 759 KB
Vos balises:
english, 1995
30
Room Temperature Contactless Electromodulation Characterization of a Wafer-Sized InGaAs/GaAs/GaAlAs Grinsch Laser Structure
Krystek, Wojciech
,
Leibovitch, M.
,
Pollak, Fred H.
,
Gumbs, Godfrey
,
Konopelski, T.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 367 KB
Vos balises:
english, 1995
31
Fourier Transform Analysis of Franz-Keldysh Oscillations Observed in Electromodulation Spectra
Holm, R. T.
,
Glembocki, O. J.
,
Tuchman, J. A.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 369 KB
Vos balises:
english, 1995
32
Characterization of AlGaAs/GaAs Heterojunction Bipolar Transistors Using Photoreflectance and Spectral Ellipsometry
Smith, Patricia B.
,
Kim, Tae S.
,
Magel, Lissa K.
,
Duncan, Walter M.
,
Ley, A. Vance
,
Brette, Nick A.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.10 MB
Vos balises:
english, 1995
33
Lineshape Analysis of Intersubband Transitions in Multiple Quantum Wells
Gumbs, G.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 376 KB
Vos balises:
english, 1995
34
Response Time For Optical Emission And Mass Spectrometric Signals During Etching Of Heterostructures
Thomas, S.
,
Chen, H. H.
,
Pang, S. W.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 417 KB
Vos balises:
english, 1995
35
Investigation of Passivation Effects in InP Hemt Layers
Hove, M. Van
,
Finders, J.
,
Zanden, K. Van Der
,
Geurts, J.
,
Rossum, M. Van
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 420 KB
Vos balises:
english, 1995
36
Exciton Dynamics in Ultrathin InAs/GaAs Quantum-Wells
Brübach, J.
,
Haverkort, J. E. M.
,
Wolter, J. H.
,
Wang, P. D.
,
Ledentsov, N. N.
,
Torres, C. M. Sotomayor
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 446 KB
Vos balises:
english, 1995
37
Effect of Heavy Doping on the Photoluminescence and Photoreflectance Spectra of Silicon and SiGe Layers.
Bru-Chevallier, C.
,
Trui, B.
,
Souifi, A.
,
Brémond, G.
,
Guillot, G.
,
Chroboczek, J. A.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 411 KB
Vos balises:
english, 1995
38
Optical And Mass Spectrometric Diagnostic Methods For Plasma Etching
Donnelly, V. M.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 482 KB
Vos balises:
english, 1995
39
Fabrication and Luminescence of Etched Quantum Rings and Vertically Coupled Dots
Philippa, G. E.
,
Galeana, J. A. Mejia
,
Cassou, C.
,
Wang, P. D.
,
Guasch, C.
,
Vögele, B.
,
Holland, M. C.
,
Torres, C. M. Sotomayor
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.96 MB
Vos balises:
english, 1995
40
Optical Characterization of Hydrogenated Silicon Films in the Extended Energy Range
Globus, T.
,
Fonash, S. J.
,
Gildenblat, G.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 448 KB
Vos balises:
english, 1995
41
Reflectivity Difference Spectra of GaAs and ZnSe (100) Surfaces
Kim, C. C.
,
Sivananthan, S.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 444 KB
Vos balises:
english, 1995
42
Optical and Electrical Characterisation of Plasma Processed N-GaAs
Murtagh, M.
,
Herbert, P. A. F.
,
Kelly, P. V.
,
Crean, G. M.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 384 KB
Vos balises:
english, 1995
43
Real-time Optical Monitoring of Epitaxial Growth Processes by p-Polarized Reflectance Spectroscopy
Dietz, Nikolaus
,
Bachmannb, Klaus J.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 429 KB
Vos balises:
english, 1995
44
In Situ Multi-Wavelength Ellipsometric Control of Thickness and Composition For Bragg Reflector Structures
Herzinger, Craig
,
Johs, Blaine
,
Chow, Peter
,
Reich, Dave
,
Carpenter, Greg
,
Croswell, Dan
,
Hove, Jim Van
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 952 KB
Vos balises:
english, 1995
45
Characterisation of the Oxidation Kinetics of Thin, Low Temperature, Electroless Plated Copper Films
Beechinor, J. T.
,
O'Reilly, M.
,
Patterson, J. C.
,
Lynch, S.
,
Lafferty, E.
,
Kelly, P. V.
,
Crean, G. M.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.11 MB
Vos balises:
english, 1995
46
Non-Destructive Characterisation of Rapid Thermally Annealed N+-Doped Polysilicon Using Spectroscopic Ellipsometry
Carline, R. T.
,
Leong, W. Y.
,
Cullis, A. G.
,
Houlton, M. R.
,
Hope, D. A.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.26 MB
Vos balises:
english, 1995
47
Closed-Loop Thickness Control of Resonant-Tunneling Diode Mbe Growth Using Spectroscopic Ellipsometry
Celii, F. G.
,
Kao, Y.-C.
,
Moise, T. S.
,
Woolsey, M.
,
Harton, T. B.
,
Haberman, K.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 846 KB
Vos balises:
english, 1995
48
In-Situ and Ex-Situ Studies of Silicon Interfaces and Nanostructures by Ellipsometry and Rds
Rossowl, U.
,
Mantese, L.
,
Frotscher, U.
,
Aspnes, D. E.
,
Richter, W.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 338 KB
Vos balises:
english, 1995
49
Spectroellipsometry Studies of Znl-x.cdxSe: From Optical Functions to Heterostructure Characterization
Lee, Joungchel
,
Hong, Byungyou
,
Burnham, J. S.
,
Collins, R. W.
,
Flack, F.
,
Samarth, N.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 413 KB
Vos balises:
english, 1995
50
Spectroscopic Ellipsometry of Strained Si/Ge Superlattices Grown by Magnetron Sputter Epitaxy
Guizzetti, G.
,
Patrini, M.
,
Sutter, P.
,
Känel, H. Von
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 289 KB
Vos balises:
english, 1995
51
Optical Characterization of AlxGal-xsb/GaSb Epitaxial Layers
Lernia, S. Di
,
Geddo, M.
,
Guizzetti, G.
,
Patrini, M.
,
Bosacchi, A.
,
Franchi, S.
,
Magnaninia, R.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 344 KB
Vos balises:
english, 1995
52
Monitoring Of The Intermediate Products In The Thermal Decomposition Of SiH4, Si2H6, SiF4 AND SiH2F2
Han, Jae Hyun
,
Ryu, Hyun-Kyu
,
Moon, Sang Heup
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 364 KB
Vos balises:
english, 1995
53
Trace-Element Accelerator Mass Spectrometry: A New Technique for Low-Level Impurity Measurements in Semiconductors
Datar, S. A.
,
Renfrow, S. N.
,
Anthony, J. M.
,
Mcdaniel, F. D.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 350 KB
Vos balises:
english, 1995
54
A Comparative Study of the Reflectance Difference Spectrum from Si(001) Using Reflectance Difference Spectroscopy /Low-Energy Electron Diffraction/Scanning Tunneling Microscopy
Lin, Jia-Ling
,
Jaloviar, S. G.
,
Mantese, L.
,
Aspnes, D. E.
,
McCaughan, L.
,
Lagally, M. G.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 288 KB
Vos balises:
english, 1995
55
High Performance Of Gettering In Hydrogen Annealed Wafer
Takeda, Ryuji
,
Hayashi, Kenro
,
Tokuoka, Fumio
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 851 KB
Vos balises:
english, 1995
56
Thermal Stability in Pd-Based Contacts to p-Type In0.53Ga0.47as Characterized by Rbs
Leech, P. W.
,
Ressel, P.
,
Reeves, G. K.
,
Zhou, W.
,
Kuphal, E.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 339 KB
Vos balises:
english, 1995
57
Scanning Electron Microscopy (Sem), Transmission Electron Microscopy (Tem) and Secondary Ion Mass Spectroscopy (Sims) Characterization of the Morphology of Aluminum Bond Pads for Surface Reflectivity Applications.
Schade, M.
,
Ai, R.
,
Stein, Y.
,
Anderson, T.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 3.12 MB
Vos balises:
english, 1995
58
Influence of Ohmic Contacts on Semi-Insulating GaAs Detector Performances
Castaldini, A.
,
Cavallini, A.
,
Canali, C.
,
Chiossit, C.
,
Papa, C. Del
,
Nava, F.
,
Lanzieri, C.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.16 MB
Vos balises:
english, 1995
59
Obic Modelling, Numerical Computation and Measurement of Silicon Parameters in The Presence of Defects
Barbero, F.
,
Maggio, G. M.
,
Moore, R. A.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.48 MB
Vos balises:
english, 1995
60
Characterization of ZnSe:N Using Screening Effects
Kuskovsky, I.
,
Neumark, G. F.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 279 KB
Vos balises:
english, 1995
61
Acoustic Emission for The Diagnostic of Semiconductor Structures
Lyashenko, O. V.
,
Perga, V. M.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 498 KB
Vos balises:
english, 1995
62
High Density Plasma Diagnostics For Predictive Model Development
Eddy, C. R.
,
Douglass, S. R.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.73 MB
Vos balises:
english, 1995
63
Structural Characterization of Reactive Ion Etched Semiconductor Nanostructures Using X-Ray Reciprocal Space Mapping
Bauer, G.
,
Darhuber, A. A.
,
Holy, V.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 866 KB
Vos balises:
english, 1995
64
Study of Periodic Surface Nanostructures Using Coherent Grating X-Ray Diffraction (CGXD)
Shen, Qun
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 2.53 MB
Vos balises:
english, 1995
65
Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors
Vanhellemont, J.
,
Janssens, K. G. F.
,
Frabboni, S.
,
Smeys, P.
,
Balboni, R.
,
Armigliato, A.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 3.21 MB
Vos balises:
english, 1995
66
Real Time Measurement of Epilayer Strain Using a Simplified Wafer Curvature Technique
Floro, J. A.
,
Chason, E.
,
Lee, S. R.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 421 KB
Vos balises:
english, 1995
67
Optical and Structural Characterization of Arsenide/Phosphide Interfaces Formed by Flow Modulation Epitaxy
Emerson, D. T.
,
Smart, J. A.
,
Whittingham, K. L.
,
Chumbes, E. M.
,
Shealy, J. R.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.25 MB
Vos balises:
english, 1995
68
Dopant Quantification By X-Ray Absorption Spectroscopy: Zn IN InP
Niu, L.
,
Karlicek, R. F.
,
Geva, M.
,
Citrin, P. H.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 312 KB
Vos balises:
english, 1995
69
Characterization Of Nitrogen Species For P-Type Doping Of Znse
Kimura, K.
,
Kajiyama, H.
,
Miwa, S.
,
Asuda, T. Y
,
Kuo, L. H.
,
Jin, C. G.
,
Tanaka, K.
,
Yao, T.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 297 KB
Vos balises:
english, 1995
70
Combine spectroscopic ellipsometry and grazing x-ray reflectance for fine characterization of complex epitaxial structures
Boher, P.
,
Stehle, J. L.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 535 KB
Vos balises:
english, 1995
71
The Uniformity Of Surface Passivation After (NH 4)2S Treatment Studied By Near-Field Scanning Optical Microscopy
Liu, Jutong
,
Kuech, T. F.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.59 MB
Vos balises:
english, 1995
72
A New Method For The Electronic And Chemical Passivation Of GaAs Surfaces Using CS2
Lee, Ju-Hyung
,
Xu, Yanzhen
,
Burrows, Veronica A.
,
McMillan, Paul F.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 369 KB
Vos balises:
english, 1995
73
Cathodoluminescence Spectroscopy For Evaluation Of Defect Passivation In GaSb
Pal, U.
,
Piqueras, J.
,
Dutta, P. S.
,
Bhat, H. L.
,
Dubey, G. C.
,
Kumar, Vikram
,
Dieguez, E.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.07 MB
Vos balises:
english, 1995
74
Cathodoluminescence Study Of Diffusion Length And Surface Recombination Velocity In III-V Multiple Quantum Well Structures
Chao, L.- L.
,
Freiler, M. B.
,
Levy, M.
,
Lin, J.-L.
,
Cargill, G. S.
,
Osgood, R. M.
,
McLANE, G. F.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.03 MB
Vos balises:
english, 1995
75
Raman Spectroscopic Study Of Ion-Implanted And Annealed Silicon.
Tuschel, David. D.
,
Lavine, James P.
,
Russell, Jeffrey B.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 262 KB
Vos balises:
english, 1995
76
Combined Room Temperature Photoluminescence And High Resolution X-Ray Diffraction Mapping Of Semiconductor Wafers
Cockerton, S
,
Cooke, M L
,
Bowen, D K
,
Tanner, B K
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 389 KB
Vos balises:
english, 1995
77
Characterization Of Micropipes And Other Defect Structures In 6H-SiC Through Fluorescence Microscopy
Vetter, W. D.
,
Dudley, M.
,
Wong, T.- F.
,
Frderich, J. T.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 1.91 MB
Vos balises:
english, 1995
78
Characterization Of ZnGe(AsxP1-x)2 Crystals By Electrolyte Electroreflectance Spectroscopy
Angelov, Mirko
,
Goldhahn, Rüdiger
,
Nennewitz, Olaf
,
Schün, Silke
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 401 KB
Vos balises:
english, 1995
79
Hydrogen Assisted Remote Plasma Enhanced Chemical Vapor Deposition of Amorphous Silicon Nitride Films
Santos-Filho, P.
,
Koh, K.
,
Stevens, G.
,
Lucovsky, G.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 432 KB
Vos balises:
english, 1995
80
Ge-Related Interfacial Defects In SiGe Alloy Structures
Macfarlane, Patricia J.
,
Zvanut, M. E.
,
Carlos, W. E.
,
Twigg, M. E.
,
Thompson, P. E.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 412 KB
Vos balises:
english, 1995
81
Process Diagnostics For Remote Plasma-Enhanced Chemicalvapor Deposition (Pecvd) Of Silicon Nitrides
Banerjee, A.
,
Lucovsky, G.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 405 KB
Vos balises:
english, 1995
82
In-Situ Fiberoptic Thermometry Measurements Of Wafer Temperature During Plasma Etching Using An Electron Cyclotron Resonance Source
Thomas, S.
,
Berg, E. W.
,
Pang, S. W.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 432 KB
Vos balises:
english, 1995
83
Simultaneous Spatially Resolved Multispectral Optical Emission Of Sputter Processes
Klein, J. D.
,
Clauso, S. L.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 346 KB
Vos balises:
english, 1995
84
An Extended Kalman Filter Based Method for Fast In-Situ Etch Rate Measurements
Vincent, T. L.
,
Khargonekar, P. P.
,
Terry, F. L.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 481 KB
Vos balises:
english, 1995
85
Optical Second Harmonic Generation Method For Silicon Material Monitoring And Characterization During Ion Implantation And Annealing Processes
Gu, Y.
,
Chou, Y. C.
,
Vu, T.
,
Yen, K.
,
Lin, Y. S.
,
Li, G. P.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 947 KB
Vos balises:
english, 1995
86
Photoluminescence and Raman Scattering from (CdSe)m,(ZnSe)n-ZnSe Multiple Quantum Wells Under Hydrostatic Pressure
Zhang, J. Q.
,
Liu, Z. X.
,
Wang, Z. P.
,
Han, H. X.
,
Li, G. H.
,
Peng, Z. L.
,
Yuan, S. X.
Journal:
MRS Proceedings
Année:
1995
Langue:
english
Fichier:
PDF, 292 KB
Vos balises:
english, 1995
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