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Volume 31

MRS Proceedings

Volume 31
1

Electron Microscopy at Atomic Resolution

Gronsky, R.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 5.08 MB
english, 1983
2

Computer Interfaced Electron Microscope

Kokubo, Y., Moriguchi, S., Hosoi, J., Watanabe, E., Nash, J.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 6.71 MB
english, 1983
5

High Resolution Tem Studies of Defects Near Si-SiO2 Interface

Mazur, J. H., Washburn, J.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 4.46 MB
english, 1983
6

An overview of Analytical Electron Microscopy

Williams, D. B.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 4.82 MB
english, 1983
7

Effects of Microstructure and Chemical Composition on Ebic Contrast in Hem Solar Cell Silicon

Sullivan, T.D.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 5.41 MB
english, 1983
8

Electron Microscopy of Semiconductors Reconstructed Surfaces

Petroff, Pierre M.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 5.05 MB
english, 1983
9

Intrinsic Point Defects and Diffusion Processes in Silicon

Tan, T. Y.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 923 KB
english, 1983
10

Structural Analyses of Metal/GaAs Contacts and Ge/GaAs and AlAs/GaAs Heterojunctions

Kuan, T. S.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.06 MB
english, 1983
11

Interfacial Reactions of Nickel films on GaAs

Chen, L.J., Hsieh, Y.F.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 2.51 MB
english, 1983
13

Reflection Electron Microscopy and Diffraction from Crystal Surfaces

Cowley, J.M.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 2.78 MB
english, 1983
14

Interpretation of the Atomic Surface Structure of Ag2O on (111) Au thin films

Krakow, William
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 5.78 MB
english, 1983
15

Formation and Transformation of Amorphous Silicide Alloys

Tu, K.N., Tien, T., Herd, S.R.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.92 MB
english, 1983
16

Dislocations, Steps and Interphase Boundary Migration

Smith, D.A.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.10 MB
english, 1983
17

Microdiffraction Studies of Small Gold Metallic Particles

Jose-Yacaman, Miguel, Gomez, Alfredo, Truszkowska, Krystyna
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 2.90 MB
english, 1983
18

High Resolution Study of the Relationship Between Misfit Accommodation and Growth of CU2-xS in Cds

Sands, T., Washburn, J., Gronsky, R.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 2.04 MB
english, 1983
19

Epitaxy of Bcc and Hexagonal Metals on Fcc(001) Substrates

Grovenor, C.R.M., Smith, D.A.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 1.29 MB
english, 1983
20

Stem Microanalysis of Hazed Polycrystalline Silicon Layers

Carpenter, G.J.C., Houghton, D.C.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 2.93 MB
english, 1983
21

Misfit Dislocations in the Interface between the Metallic and Insulating Phases in Cr Doped V203

Otsuka, Nobuo, Sato, Hiroshi
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.38 MB
english, 1983
22

The Structure of Grain Boundaries and Phase Boundaries in Ceramics

Carter, C. B.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 8.65 MB
english, 1983
23

Applications of High Resolution Electron Microscopy in Ceramics Research

Van Tendeloo, G.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 9.01 MB
english, 1983
24

The Defect Structures of Fe9S10

Nguyen, Thao A., Hobbs, Linn W.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 7.43 MB
english, 1983
25

Tem of Dislocations in Sapphire (α−Al2O3)

Lagerlöf, K.P.D., Mitchell, T.E., Heuer, A.H.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 7.30 MB
english, 1983
26

Tem Observations of Grain Boundaries in Ceramics

Rühle, M.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.72 MB
english, 1983
27

Fault Structures in CVD Silicon Nitride

Shaw, T.M., Steeds, J.W., Clarke, D.R.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 1.75 MB
english, 1983
28

Microanalysis with high Spatial Resolution

Batson, P. E., Grovenor, C. R. M., Smith, D. A., Wong, C.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 349 KB
english, 1983
29

High Resolution Tem Studies of β-Alumina Type Structures

Morrissey, K. J., Elgat, Z., Kouh, Y., Carter, C. B.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.46 MB
english, 1983
30

The γ→α Phase Transformation in Al2O3

Tucker, D. S., Hren, J. J.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.23 MB
english, 1983
31

Calcium Site Occupancy in BaTiO3

Chan, H. M., Harmer, M. P., Lal, M., Smyth, D. M.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 1.97 MB
english, 1983
32

Characterisation of Portland Cement Hydration by Electron Optical Techniques

Scrivener, Karen L., Pratt, P. L.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.52 MB
english, 1983
33

Ordered Defect-Fluorite Compounds in ZrO2 Alloys

Farmer, S., Hangas, J., Lanteri, V., Mitchell, T.E., Heuer, A.H.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 5.38 MB
english, 1983
34

Image Processing for Electron Microscope Investigations of Materials

Krakow, William
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 8.87 MB
english, 1983
35

Combination of CBD and High Resolution with 400 kv

Suzuki, S., Honda, T., Kokubo, Y., Harada, Y.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 2.45 MB
english, 1983
36

Recent Development in Hitachi Transmission Electron Microscope

Isakozawa, Shigeto, Matsui, Isao, Kamimura, Shoji, Tonomura, Akira
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.31 MB
english, 1983
37

Electron Microscopy and Analysis at Higher Voltages: The Philips EM430 300kV Microscope

Hagemann, Peter N., Fahy, John S.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.26 MB
english, 1983
38

Tem/Ebic Investigations of Structural Defects in Polycrystalline Solar Cells

Ast, D.G., Cunningham, B., Gleichmann, R.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 7.63 MB
english, 1983
39

Dopant Site Location by Electron Channeling in Ion Implanted Silicon

Pennycook, S. J., Narayan, J., Holland, O.W.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 1.13 MB
english, 1983
40

Structure of Thermally-Induced Microdefects in Czochralski Silicon

Ponce, F. A., Hahn, S.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 5.46 MB
english, 1983
41

The Characterisation of Interfacial Dislocation Structures

Clark, W. A. T.
Journal:
MRS Proceedings
Année:
1983
Langue:
english
Fichier:
PDF, 3.49 MB
english, 1983