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Volume 25

MRS Proceedings

Volume 25

1

Specific Contact Resistance Measurements on Multilayer Interconnect Structures.

Harrison, H.B., Reeves, G.K.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 327 KB

english, 1983

2

Initial Phase formation at the Interface of Ni, Pd, or Pt and Si

Nemanich, R. J., Tsai, C. C., Stafford, B. L., Abelson, J. R., Sigmon, T. W.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 378 KB

english, 1983

3

Interactions between Lattice Dislocations and Interfaces in Solids

Liu, J. S., Balluffi, R. W.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 5.82 MB

english, 1983

4

Effect of Cu on Al-Transition Metal Reaction Kinetics

Huang, H.-C. W., Wittmer, M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 358 KB

english, 1983

5

An Interface-Sensitive Conversion Electron Mössbauer Spectroscopic Study of the Ion Beam Induced Reactions at Fe-Si Interface.

Godbole, V.P., Bhide, V.G., Ghaisas, S.V., Kanetkar, S.M., Joshee, R.S., Ogale, S.B.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 730 KB

english, 1983

6

Selective Growth, Diffusion Layers and the Schottky Barrier Height in Nickel Silicide-Silicon Interfaces

Erskine, J. L., Chang, Yu-Jeng

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 564 KB

english, 1983

7

Marker Experiments for the moving Species in Silicides During Solid Phase Epitaxy of Evaporated Si

Lien, Chuen-Der, Bartur, Meir, Nicolet, Marc-A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 362 KB

english, 1983

8

Electrostatic Spray Deposition of Antimony Doped Tin Oxide on Soda-Lime Glass

Fabian, D.J., Colbow, K., Clayman, B.P., Mackintosh, A., Manning, G., Morrison, S.R.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 219 KB

english, 1983

9

The Measurement of Silicide Schottky Barrier Heights by Use of Photovoltaic Techniques

Kuech, T.F., Wu, C.S., Lau, S.S.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 329 KB

english, 1983

10

Epitaxial Nickel Disilicide Formation by Electron Beam Annealing

Harper, R.E., Maydell-Ondrusz, E.A., Wilson, I.H., Stephens, K.G.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 765 KB

english, 1983

11

Ambient Effects on Thin Film Interactions

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.46 MB

english, 1983

12

Effect of Nitrogen and Oxygen Impurities on Tantalum Silicide Formation

Ho, K. T., Lien, C.-D., Nicolet, M-A., Scott, D. M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.09 MB

english, 1983

13

Oxygen Effect and Redistribution in Cobalt Silicide Formation

Lien, Chuen-Der, Nicolet, Marc-A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 386 KB

english, 1983

14

Oxygen Influence on Titanium Silicide Formation

Bentini, G.G., Berti, M., Cohen, C., Drigo, A.V., Guerri, S., Nipoti, R., Siejka, J.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 284 KB

english, 1983

15

RBS and TEM Analysis of Ta Silicides on GaAs

Kavanagh, K.L., Chen, S.H., Palmstrom, C.J., Carter, C.B.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 934 KB

english, 1983

16

Tin as a Diffusion Barrier For III-V Metallization

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.19 MB

english, 1983

17

Prediction of Silicide First Phase and Phase Sequence from Heats of Formation

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 709 KB

english, 1983

18

Kinetics of Phase Formation in Cu-Al Thin Films Couples Studied by In-Situ X-Ray and Rutherford Backscattering Analysis.

Hamm, R. A., Vandenberg, J. M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 88 KB

english, 1983

19

Diffusion of AS, B, and P In Tasi2

Eichinger, P., Frenzel, E., Neppl, F.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 283 KB

english, 1983

20

Ion Beam Enhanced Adhesion

Tombrello, T. A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 363 KB

english, 1983

21

Ion Beam Enhanced Adhesion of Thin Films

Baglin, J. E. E., Clark, G. J., BØttiger, J.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 879 KB

english, 1983

22

Electron and Ion Beam-Enhanced Adhesion

Mitchell, I.V., Williams, J.S., Sood, D.K., Short, K.T., Johnson, S., Elliman, R.G.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.40 MB

english, 1983

23

The Radiation Enhanced Adhesion of Gold on PTFE

Sofield, C.J., Woods, C.J., Wild, C., Riviere, J.C., Welch, L.S.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 313 KB

english, 1983

24

Effects on Metal/Metal-Oxide Interface Adhesion Due to Electron and Ion Irradiation

Bøttiger, J., Baglin, J. E. E., Brusic, V., Clark, G. J., Anfiteatro, D.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 774 KB

english, 1983

25

Modification and Study of Polymer Films Using High Energy Ion Beams

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.44 MB

english, 1983

26

Phase Formation and Kinetic Processes in Silicide Growth.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 532 KB

english, 1983

27

High Energy Ion Induced Decomposition and Diffusion in Thin Polymer Films

Venkatesan, T., Edelson, D., Brown, W. L.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 325 KB

english, 1983

28

Electron Energy Loss Spectroscopy of Polycrystalline and Ion Irradiated Ni-Al Alloys

Grunest, L.A., Barbour, J.C., Hung, L.S., Mayer, J.W., Ritsko, J.J.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.20 MB

english, 1983

29

A Comparison of Electron Energy Loss Spectroscopy and Electron Diffraction for Polycrystalline and Xe+ Irradiated Nickel Silicides

Barbour, J.C., Grunes, L.A., Mayer, J.W.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.17 MB

english, 1983

30

Formation of Alloy Phases at Fe-Al Interface by Ion Beam Mixing, asRevealed by Interface-Sensitive Conversion Electron Mössbauer Spectroscopic Measurements

Godbole, V.P., Bhide, V.G., Ghaisas, S.V., Kanetkar, S.M., Chaudhari, S.M., Ogale, S. B.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 385 KB

english, 1983

31

Interaction of Al Films on Single Crystal Si Substrates Induced by Ion Irradiation and Post-Anneal

Hung, L. S., Chen, S. H., Mayer, J. W.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.61 MB

english, 1983

32

A General Treatment of Antiphase Domain Formation and Identification at Polar-Nonpolar Semiconductor Interfaces.

Pond, R.C., Gowers, J.P., Holt, D.B., Joyce, B.A., Neave, J.H., Larsen, P.K.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.66 MB

english, 1983

33

On the Segregation of in Solutes to High-Angle (001) Twist Grain Boundaries in Al

Wolf, D., Lam, N. Q.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 437 KB

english, 1983

34

Precipitation of Copper in Transmutation Doped Silicon

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.75 MB

english, 1983

35

Formation of Microtwins in Low Angle Grain Boundaries in Germanium

Elgat, Z., Carter, C. B.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.09 MB

english, 1983

36

Structure and Dissociation of 15° Tilt Boundaries in Germanium

Skrotzki, W., Wendt, H., Carter, C. B., Kohlstedt, D. L.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.48 MB

english, 1983

37

Nucleation Phenomena in Transitions from two to three phases, diffusion Couples, Phase Stability,the thin film formation of some silicides

D»Heurle, F. M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 416 KB

english, 1983

38

Metal Induced Grain Growth in Germanium and Silicon Thin Films.

Grovenor, C.R.M., Smith, D.A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1012 KB

english, 1983

39

The Morphology of the Polysilicon - SiO2 Interface

Bravman, J.C., Sinclair, R.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.39 MB

english, 1983

40

XPS Study of the Al/SiO2 Interface Viewed From the SiO2 Side

Hecht, M.H., Grunthaner, F.J., Maserjian, J.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 358 KB

english, 1983

41

Chemical Reaction at the Ni/Inp (110) and Ni/GaAs (110) Interfaces

Kendelewicz, T., Petro, W. G., Williams, M. D., Pan, S. H., Lindau, I., Spicer, W. E.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 372 KB

english, 1983

42

Photoemission Studies of the Ag/InP(110) Interface: Interfacial Reactions and Schottky Barrier Formation

Petro, W. G., Kendelewicz, T., Babalola, I. A., Lindau, I., Spicer, W. E.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 384 KB

english, 1983

43

Thermal behavior of Metal-Metal-Silicon or Metal-Silicide-Silicon Structures for Pt, Ni, and Cr

Barcz, A. J., Bartur, M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 357 KB

english, 1983

44

Photoemission Studies Of The CU-GaAs(ll0) Interface Formation

Pan, S. H., Kendelewicz, T., Petru, W. G., Williams, M. D., Lindau, I., Spicer, W. E.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 396 KB

english, 1983

45

The Chemisorption of Fluorine on Silicon (111) Surfaces

Mcfeely, F.R., Morar, J., Shinn, N. D., Landgren, G., Himpsel, F. J., Jugnet, Y.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 571 KB

english, 1983

46

Thermoelectric Effects Across Solid-Liquid Gallium Interface

Alvarez, J., Peteves, S.D., Abbaschian, G.J.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 309 KB

english, 1983

47

The Early Stages of Silicide Formation on Metal and Silicon Surfaces, Time-of-Flight Atom-Probe Studies of Atomic Structures and Compositions

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.06 MB

english, 1983

48

Structural Effects in the Initial Stages of Epitaxy

Pimbley, J. M., Lu, T.-M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 265 KB

english, 1983

49

The Growth and Characterization of Epitaxial Fluoride Films on Semiconductors

Phillips, Julia M., Gibson, J. M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 3.44 MB

english, 1983

50

Shallow Contact Formation of Gadolinium Silicide

Cheng, I. C., Lau, S. S., Thompson, R. D., Tu, K. N.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 767 KB

english, 1983

51

Epitaxial Growth of Fluoride Films on Silicon Substrates

Ishiwara, Hiroshi, Asano, Tanemasa

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.17 MB

english, 1983

52

Crystallography and Interfaces of Epitaxial Fluorite Metals and Insulators on Semiconductors

Gibson, J.M., Tung, R.T., Phillips, J.M., Poate, J.M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 3.11 MB

english, 1983

53

Growth and Characterization of Epitaxial GaAs on Ge/Si Substrates

Fletcher, Robert M., Ken Wagner, D., Ballantyne, Joseph M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.38 MB

english, 1983

54

On the Structure of Metal Silicide:Silicon Interfaces.

Cherns, D., Pond, R.C.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.84 MB

english, 1983

55

Domain and Interface Structures of Epitaxial PtSi

Kawarada, H., Ohdomari, I., Horiuchi, S.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.17 MB

english, 1983

56

Tem Study of Pt Silicide Formation on Clean Si Surfaces

Yokota, Y., Matz, R., Ho, P.S.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.96 MB

english, 1983

57

Epitaxial Growth of FeSi2 on (111)Si

Cheng, H.C., Chen, L.J., Your, T.R.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 3.23 MB

english, 1983

58

Grain boundary Diffusion of Ni through Pd2Si

Zingu, E. C., Mayer, J. W.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 360 KB

english, 1983

59

Material Properties of Semiconductor Strained-Layer Superlattices

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 565 KB

english, 1983

60

Ion Channeling in Elastically Strained Superlattices

Barrett, John H.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 744 KB

english, 1983

61

Ion Channeling Analysis of GaAsxP1-X/Gap Strained-Layer Superlattices

Picraux, S. T., Biefeld, R. M., Osbourn, G. C., Chu, W. K.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 842 KB

english, 1983

62

Resonance between Channeled Particle Wavelengths and Periodicity of Strained-Layer Superlattices

Chu, W. K., Picraux, S. T., Biefeld, R. M., Osbourn, G. C., Ellison, J. A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 762 KB

english, 1983

63

Superlattice Interface and Lattice Strain Study by Ion Channeling

Pan, C. K., Zheng, D. C., Chu, W. K., Chang, C.-A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 66 KB

english, 1983

64

Tetragonal Distortion in VPE and LPE In1-xGaxAs Grown on (100) Inp

Macrander, A. T., Chu, S. N. G.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 794 KB

english, 1983

65

Tetragonal Strain in MBE GexSi1-x Films Grown on (100) Si Observed by Ion Channeling and X-Ray Diffraction

Fiory, A. T., Feldman, L. C., Bean, J. C., Robinson, I. K.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 356 KB

english, 1983

66

Sub-Boundary Formation and Suppression in Silicon films Recrystallized by Scanned Zone Melting

Pfeiffer, Loren, Gibson, J. M., Kovacs, T.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 3.10 MB

english, 1983

67

Lateral Solid Phase Epitaxy of Evaporated Amorphous Si Films onto SiO2 Patterns

Yamamoto, H., Ishiwara, H., Furukawa, S., Tamura, M., Tokuyama, T.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.43 MB

english, 1983

68

Abnormal Grain Growth in Ultra-Thin Films of Germanium on Insulator

Yonehara, T., Tihompson, C.V., Smith, Henry I.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.64 MB

english, 1983

69

Nitrogen Ion Implantation in Silicon: Structure of the Subsurface Region

Liliental, Z., Carpenter, R.W., Fathya, D., Kelly, J.C.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.71 MB

english, 1983

70

Analysis of the Si-ON-Insulator Structure by Modeling of the Interface Atomic Arrangement

Saito, T., Yamakoshi, Y., Ohdomari, I.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 698 KB

english, 1983

71

An Auger Electron Spectroscopy (AES) Investigation into the Effect Annealing on the Phase Distribution of Ion Implanted Oxygen in Silicon

Tuppen, C G, Davies, G J, Taylor, M R, Heckingbottom, R

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 723 KB

english, 1983

72

Metallurgy and Morphology of the Interface of AuGe Ohmic Contact to GaAs

Lakhani, Amir A., Urech, David R.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.62 MB

english, 1983

73

X-ray Microanalysis and High Resolution Imaging of Ge-Au-Ni Metal Layers on Gallium Arsenide

Fathy, D., Krivanek, O. L., Spence, J. C. H., Paulson, W. M.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.39 MB

english, 1983

74

Low Temperature (150–250°C) Deposition of n+ and p+ Microcrystalline Silicon for VLSI Device Contacts

Rajeswaran, G., Vanier, P. E., Kampas, F. J., Corderman, R. R.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.04 MB

english, 1983

75

Residual Stresses in Co-Sputtered Films of Ta and Si on Substrates of Silicon and Oxide.

Goldsmith, C. C., Campbell, D. R., Mader, S.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 923 KB

english, 1983

76

The Reaction between thin Ni and Co Films and their Disilicides

Cahoon, E.C., Comrie, C.M., Pretorius, R.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 371 KB

english, 1983

77

Electromigration in Al And Al-Alloy Thin-Film Conductors

Pasco, R.W., Felton, L.E., Schwarz, J.A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 359 KB

english, 1983

78

Barrier Properties of Tasi2 in Contact With Al-Metallization

Neppl, F., Schwabe, U.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 344 KB

english, 1983

79

Interface Reactions In Tasi 2/Si Contacts at High Temperature

Oppolzer, H., Neppl, F., Hieber, K.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 3.03 MB

english, 1983

80

Tem Studies of Cosputtered Tisi 2 Films Containing Excess Silicon.

Beyers, R., Sinclair, R., Thomas, M. E.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 1.81 MB

english, 1983

81

The Effect of Beam Species and Anneal History on Silicon Surface Damage Induced by Ion Beam Etching

Davis, R. J., Singh, R., Fonash, S. J., Caplan, P. J., Poindexter, E. H.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 310 KB

english, 1983

82

Effect of Low Energy Hydrogen Implants on Damage Caused by Argon Ion Beam Etching

Climent, A., Wang, J.-S., Fonash, S. J.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 610 KB

english, 1983

83

Introduction of Electrical Defects in P-Type Silicon due to Electron-Beam and RF Sputtering Metallization Processes

Paz, O., Auret, F. D.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 325 KB

english, 1983

84

Rectifying Structures Resulting from Gold, Cadmium and Thallium Deposited on Selenium

Champness, C.H., Nerguizian, V., Nerguizian, C., Chan, A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 385 KB

english, 1983

85

Pt and Pd Silicides and Pd Germanide as Contact Metallizations for GaAs

Marshall, E. D., Wu, C. S., Scott, D. M., Lau, S. S., Kuech, T. F.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 389 KB

english, 1983

86

SI Contacts Formed from Spun-on Metallo-Organic Solutions

Pai, C. S., Zhang, B., Scott, D. M., Lau, S. S., Bartur, M., Tseng, W. F.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 383 KB

english, 1983

87

Analysis of Implanted Boron Profiles Across the Si-SiO2 Interface by Secondary Ion Mass Spectrometry.

Deline, V. R., Johnson, N. M., Christel, L. A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 357 KB

english, 1983

88

Near-Surface and Interfacial Profiling by Neutron Depth Profiling (NDP) and Secondary Ion Mass Spectrometry (SIMS)

Downing, R. G., Fleming, R. F., Maki, J. T., Simons, D. S., Stallard, B. R.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 101 KB

english, 1983

89

Quantitation of Secondary Ion Mass Spectrometry (SIMS) for HgCdTe.

Lapides, Lawrence E., Whiteman, George L., Wilson, Robert G.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 345 KB

english, 1983

90

Structure of Au/Ge/Au Multilayer Ohmic contacts to GaAs

Kim, Tae-Il, Chung, D. D. L.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.15 MB

english, 1983

91

Lateral Silicide Growth

Zheng, L. R., Zingu, E., Mayer, J. W.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.34 MB

english, 1983

92

The Kinetics of Platinum Silicide Formation Using CW Lamp Annealing

Hopkins, C. G., Baumann, S. M., Blattner, R. J.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 220 KB

english, 1983

93

A Comparison of Thermal, Line-Source Electron Beam and CW Laser Annealing for the Fabrication of Ersi2 Schottky Barrier on Si.

Wu, C. S., Scott, D.M., lau, S. S, Wakita, A., Sigmon, T. W., Knapp, J. A., Picraux, S. T.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 372 KB

english, 1983

94

Formation of Titanium Disilicide by Electron Beam Irradiation Under Non Steady State Conditions

Maydell-Ondrusz, E A, Harper, R E, Abid, A, Hemment, P L F, Stephens, K G

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 814 KB

english, 1983

95

Transport Studies in Single-Crystal Films of Cosi2 and Nisi2

Hensel, J. C., Tung, R. T., Poate, J. M., Unterwald, F. C., Jacobson, D. C.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 315 KB

english, 1983

96

Removing Grain Boundary Effects in Polycrystalline Silicon Using a Minority Carrier Mirror Concept

Kai, F. Y. T., Jackson, M. A., Thayer, M., Anderson, W. A.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 609 KB

english, 1983

97

Epitaxial Growth of NiSi2 on (011)Si

Chen, L.J., Lin, W.T., Chang, M.B.

Journal:

MRS Proceedings

Année:

1983

Langue:

english

Fichier:

PDF, 2.44 MB

english, 1983