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Volume 41; Issue 1

Microelectronics Reliability

Volume 41; Issue 1

1

Proportional difference estimate method of determining characteristic parameters of normal and log–normal distributions

Fuchen Mu, Changhua Tan, Mingzhen Xu

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 79 KB

english, 2001

2

The coherence of the gate and drain noise in stressed AlGaAs–InAlGaAs PHEMTs

B.K Jones, C.N Graham, A Konczakowska, L Hasse

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 505 KB

english, 2001

3

Understanding Semiconductor Devices; Sima Dimitrijev. Oxford University Press, New York. 2000. ISBN: 0-19-513186-X

Ninoslav Stojadinovic

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 46 KB

english, 2001

4

Status and trends of silicon RF technology

Joachim N. Burghartz

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 383 KB

english, 2001

5

New expression for base transit time in a bipolar transistor for all levels of injection

M.M.Shahidul Hassan, A.H. Khandoker

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 225 KB

english, 2001

6

On the calculation of gate tunneling currents in ultra-thin metal–insulator–semiconductor capacitors

W. Magnus, W. Schoenmaker

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 150 KB

english, 2001

7

Reliability physics of compound semiconductor transistors for microwave applications

M Borgarino, R Menozzi, D Dieci, L Cattani, F Fantini

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 209 KB

english, 2001

8

Monte Carlo simulation of electronic characteristics in short channel δ-doped AlInAs/GaInAs HEMTs

Javier Mateos, Tomás González, Daniel Pardo, Virginie Hoel, Alain Cappy

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 326 KB

english, 2001

9

Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors

G Golan, E Rabinovich, A Inberg, A Axelevitch, G Lubarsky, P.G Rancoita, M Demarchi, A Seidman, N Croitoru

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 318 KB

english, 2001

10

Highly reliable spot-size converter integrated laser diodes over a wide temperature range for access network systems

H Oohashi, M Fukuda, Y Kondo, M Yamamoto, Y Kadota, Y Kawaguchi, K Kishi, Y Tohmori, K Yokoyama, Y Itaya

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 727 KB

english, 2001

11

Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle

H. Ohyama, E. Simoen, S. Kuroda, C. Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 409 KB

english, 2001

12

Time-dependent dielectric breakdown of SiO2 films in a wide electric field range

A Teramoto, H Umeda, K Azamawari, K Kobayashi, K Shiga, J Komori, Y Ohno, A Shigetomi

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 333 KB

english, 2001

13

A study of the effects of tunneling currents and reliability of sub-2 nm gate oxides on scaled n-MOSFETs

Nian Yang, Jimmie J Wortman

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 679 KB

english, 2001

14

Correlation between predicted cause of SRAM failures and in-line defect data

Peter Coppens, Guido Vanhorebeek, Eddy De Backer

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 264 KB

english, 2001

15

Alternative CMOS or alternative to CMOS?

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 763 KB

english, 2001

16

A wavelet analysis of 1/f and white noise in microwave transistors

Gaetano Ferrante, Dominique Persano Adorno

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 192 KB

english, 2001

17

Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes

X.Y Chen, A Pedersen, A.D van Rheenen

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 205 KB

english, 2001

18

Evaluation of thick-film resistor structural parameters based on noise index measurements

M.M Jevtić, Z Stanimirović, I Stanimirović

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 306 KB

english, 2001

19

An image system for fast positioning and accuracy inspection of ball grid array boards

Chern-Sheng Lin, Li Wen Lue

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 553 KB

english, 2001

20

Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents

Klaus-Willi Pieper, Martin Sauter

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 333 KB

english, 2001

21

Guidebook for Managing Silicon Chip Reliability; Michael G. Pecht, Riko Radojcic, Gopal Rao. CRC Press LLC, Boca Raton, 1999, 224 pp. ISBN: 0-8493-9624-7

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 57 KB

english, 2001

22

Editorial

Ninoslav Stojadinovic, Michael Pecht

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 26 KB

english, 2001