Volume 14; Issue 5

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Microelectronics Journal
Volume 14; Issue 5

Microelectronics Journal

Volume 14; Issue 5

1

Editorial

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 43 KB

english, 1983

2

High slew rate CMOS operational amplifier employing internal transistor compensation

Bingxin Wu, John Mavor

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 1.54 MB

english, 1983

3

Consequences of contact resistance in very-small-geometry CML gates

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 827 KB

english, 1983

4

CMOS regenerative logic circuits

Branko L. Dokić

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 407 KB

english, 1983

5

Novel switched capacitor realisations of floating FDNC

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 154 KB

english, 1983

6

A data-base for IC mask making

N.N. Kundu, S.N. Gupta, A.K. Bagchi, D.R. Nagpal, A.V. Ramani, S. Khokle

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 456 KB

english, 1983

7

How a computer is developed and produced

Joachim Heusler

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 10.20 MB

english, 1983

8

Optoelectronics: An introduction

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 59 KB

english, 1983

9

Gallium: Arsenide and related compounds 1982

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 131 KB

english, 1983

10

Speech enhancement

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 124 KB

english, 1983

11

Packaging trade-offs for an LSI-oriented very high-speed computer, the HITAC M-200H: Tsuneyo Chiba, Akira Masaki, Kennichi Furumaya and Satoshi Hososaka IEEE Trans. Components, Hybrids Mfg Technol. CHMT-4, (2) 166 (June 1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 84 KB

english, 1983

12

The effect of high speed laser trimming on accuracy and stability of thick film resistors: Rene E. Cote Electrocomponent Sci. Technol. 8, 181 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 84 KB

english, 1983

13

interactive design system for hybrid ICs: Roshi Shiraishi, Kaoru Kawamura and Masaaki Hayashi Electrocomponent Sci. Technol. 8, 221 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 104 KB

english, 1983

14

Erlevel insulation reliability evaluation: Seph J. Gajda, Gary J. Lindstrom and Onald J. Delorenzo IEEE Trans. Components Hybrids Mfg Technol. CHMT-4 (4), 509 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 104 KB

english, 1983

15

Advances in low cost silver-containing thick film conductors: Barry E. Taylor, John J. Felten, Samuel J. Horowitz, John R. Larry and Richard M. Rosenberg Electrocomponent Sci. Technol. 9, 67 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 212 KB

english, 1983

16

Reliability evaluation of aluminium-metallised MOS dynamic RAM's in plastic packages in high humidity and temperature environments: Kurt M. Striny and Arthur W. Schelling IEEE Trans. Components Hybrids Mfg Technol. CHMT-4 (4), 476 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 111 KB

english, 1983

17

Resistors screen printed on ceramic-coated steel substrates: Radomir Kuzel and Josefbroukal IEEE Trans. Components Hybrids Mfg Technol. CHMT-4 (3), 235 (Sept 1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 111 KB

english, 1983

18

The influence of boron induced and oxidation induced defects on bipolar transistor slice yield: R. R. Sutherland Solid-St. Electron. 25 (1), 15 (1982)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 101 KB

english, 1983

19

Electrical characteristics of polymer thick film resistors, Part I: experimental results: Shen-Li Fu, Mong-Song Liang, Toyotaro Shiramatsu and Tien-Shou Wu IEEE Trans. Components Hybrids Mfg Technol. CHMT-4 (3), 283 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 101 KB

english, 1983

20

Development and evaluation of a pre-encapsulating cleaning process to improve realiability of HICs with aluminium metallised chips: Melanie Iannuzzi IEEE Trans. Components Hybrids Mfg Technol. CHMT-4 (4), 429 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 101 KB

english, 1983

21

X-ray and microscopic investigations of resistors containing CdO and RuO2: Radomir Kuzel, Josefbroukal and Dobroslav Kindl IEEE Trans. Components Hybrids Mfg Technol CHMT-4 (3), 245 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 101 KB

english, 1983

22

Integrated optics: a tutorial review: P. J. R. Laybourn and J. Lamb Radio Electronic Eng. 51 (7/8), 397 (July/August 1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 102 KB

english, 1983

23

Model of impurity diffusion from an oxide source into silicon: Alicja Checielewska and Jerzy Pultorak Electron. Technology 12 (4), 69 (1979)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 102 KB

english, 1983

24

Arsenic spin-on source for deep junction formation: P. Madhusudana Prasad and V. P. Sundarsingh Microelectronics J. 12 (6), 15 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 102 KB

english, 1983

25

Electronic structure of SiO2 (111) thin film: S. Ciraci and S. Elliatioglu Solid State Communications 40, 587 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 102 KB

english, 1983

26

VLSI circuit development for future applications: D. Howard Phillips Solid State Technology 77 (July 1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 102 KB

english, 1983

27

Internal gettering in silicon: Robert A. Craven and Harold W. Korb Solid State Technology 55 (July 1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 102 KB

english, 1983

28

Residual stress in thick films

P.L. Kirby, A. Owens

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 370 KB

english, 1983

29

The influence of the area of a thin film capacitor on the breakdown voltage: T. Berlicki Electrocomponent Sci. Technol. 9, 111 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 84 KB

english, 1983

30

Design and evaluation of RC active filters for hybrid thick film implementation: Robert Leuenberger and George S. Moschytz IEEE Trans. Components Hybrids Mfg Technol. CHMT-4 (3), 273 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 84 KB

english, 1983

31

Ider attachment of leaded components to ck film hybrids: Cholas T. Panousis and R. C. Kershner IEEE Trans. Components Hybrids Mfg Technol. CHMT-4 (4), 411 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 104 KB

english, 1983

32

Solder post attachment of ceramic chip carriers to ceramic film integrated circuits: Peter M. Hall IEEE Trans. Components Hybrids Mfg Technol. CHMT-4 (4), 403 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 104 KB

english, 1983

33

Automatic production system for circuit boards with universal hybrid integrated circuits: Mitsuo Ohsawa Electrocomponent Sci. Technol. 8, 37 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 111 KB

english, 1983

34

Improved cost effectiveness and product reliability through solder alloy development: Dennis R. Olsen and Keith G. Spanjer Solid-St. Technol., 121 (Sept 1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 101 KB

english, 1983

35

Nichrome thin film technology and its application: Joachim Rolke Electrocomponent Sci. Technol. 9, 51 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 101 KB

english, 1983

36

Reference materials and the semiconductor industry: W. M. Bullis and J. R. Ehrstein Solid-St. Technol., 56 (Nov 1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 102 KB

english, 1983

37

A study of masking properties of SiO2 and photoresists with boron ion implantation: Jarmila Cervena, Vladimir Hnatowicz, Jiri Hoffman, Jirikvitek, Pavel Onheiser, and Vladimir Rybka TESLA Electronics 1, 16 (1981)

Journal:

Microelectronics Journal

Année:

1983

Langue:

english

Fichier:

PDF, 102 KB

english, 1983