Volume 13; Issue 1

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Microelectronics Journal
Volume 13; Issue 1

Microelectronics Journal

Volume 13; Issue 1

1

Editorial board

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 75 KB

english, 1982

2

Guest editorial

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 167 KB

english, 1982

3

The growth of semi-insulating gallium arsenide by the LEC process

B. Lent, M. Bonnet, N. Visentin, J.P. Duchemin

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 1.24 MB

english, 1982

4

LPE of GaAs and related compounds: substrate orientation and surface morphology

E. Bauser, K.W. Benz

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 1.75 MB

english, 1982

5

GaAs for high-speed digital circuits

A.W. Livingstone

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 1.75 MB

english, 1982

6

On properties of the relaxation semiconductors GaAs: O and GaAs: Cr-a short overview

G. Badics, Z. Szalmassy

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 409 KB

english, 1982

7

Quasistatic and nonequilibrium phenomena in MOS structures under the influence of a constant gate-current bias: P. G. C. Allman and J. G. Simmons IEE Proc. 127(6), 312 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

8

VLSI device phenomena in dynamic memory and their application to technology development and device design: R. R. Troutman IBM J. Res. Devel. 24(3), 299 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

9

Microcomputer draws only 3μA: J. G. Posa Electronics p.143 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

10

Measurement science is catching up: R. W. Comerford Electronics p.86 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

11

Lowered I-F shrinks FM radio onto one chip: J. Gosch Electronics p.77 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

12

C-MOS read-only memory mates with a host of processors: B. Donoghue Electronics p.127 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

13

Low-power EE-PROM can be programmed fast: E. K. Shelton Electronics p.89 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

14

A silicon and aluminium dynamic memory technology: R. A. Larsen IBM J. Res. Devel. 24(3) 268 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

15

64-K static RAM surrounds n-MOS cells with C-MOS circuits: T. Ohzone Electronics p.145 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

16

Active filters and hybrid technology: P. L. Moran Electrocomponent Sci. Technol. 6, 67 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

17

TiNx thin-film resistors for hybrid integrated circuits: Z. Kempisty, L. Krol-Stepniewska and W. Posadowski Electrocomponent Sci. Technol. 6, 231 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

18

Numerical analysis of the resistance of interference-fit pin connections: E. Guancial IEEE Trans. Components, Hybrids Mfng Technol. Chmt-3(3), 402 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

19

A new approach to the topological design of hybrid circuits: W. Ulbrich and R. Van Der Leeden Electrocomp. Sci. Technol. 7, 181 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

20

Design and development of a 68-lead nonhermetic leaded chip carrier: A. J. Masessa and R. G. Mohr IEEE Trans. Components, Hybrids Mfng Technol. Chmt-3(3), 424 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

21

A computer programme with temperature gradient capability for the network analysis of hybrid circuits: C. R. Zimmer Electrocomponent Sci. Technol. 6, 277 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

22

Stress distributions around an interference-fit pin connection in a plated through hole: R. P. Goel and E. Guancial IEEE Trans. Components, Hybrids Mfng Technol. Chmt-3(3), 392 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

23

Advances in thin-film implementation of RC-active filters: E. Luder Frequenz 34(9), 248 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

24

Low pinch-off voltage FET logic (LPFL): LSI oriented logic approach using quasinormally off GaAs MESFETs: G. Nuzillat, F. Damay-Kavala, G. Bert and C. Arnodo IEE Proc. 127, I(5), 287 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

25

V-groove isolated BIFET technology for micropower ICs: S. D. S. Malhi and C. A. T. Salama IEE Proc. 127, I(4), 169 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

26

Chip capacitors tackle mounting and reliability problems: F. Kaneko, F. Ohnishi and N. Yamana J. Electron, Engng. p.45 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

27

Design of ion implanted resistors with low 1/f noise: C. J. M. Das and W. M. C. Sansen Microelectron. J. 11(3) 24 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

28

Foil circuits: K. H. Houska Electrocomp. Sci. Technol. 7, 143 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

29

Thin film Al-Al2O3-Al capacitors with dielectric layer formed at 400°C: S. J. Osadnik and T. Berlicki Electrocomponent Sci. Technol. 6, 219 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

30

Thin film with surface disorder in the average t-matrix approximation: A. Wachniewski Solid St. Commun. 35, 837 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

31

Electrical transport in thick film resistors: R. M. Hill Electrocomp. Sci. Technol. 6, 141 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

32

Thermochemical calculations on the LPCVD of Si3N4 and SiO2: K. E. Spear and M. S. Wang Solid-St. Technol. p.63 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

33

Effects of silicon nitride encapsulation on MOS device stability: R. C. Sun, J. T. Clemens and J. T. Nelson IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.244 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

34

A latent failure mechanism for surface acoustic wave components utilising lithium niobate: D. E. Allen, B. Bertiger and W. Daily IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.213 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

35

Reliability analysis of several conductors at high current densities for use in bubble memories: M. H. Shearer and F. Quadri IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.95 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

36

Failure analysis and reliability of thermal printing devices: L. C. Wagner IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.232 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

37

Corrosion model for plastic encapsulated and hermetic modules: G. Di Giacomo IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.275 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

38

Deformation of Al metallisation in plastic encapsulated semiconductor devices caused by thermal shock: M. Isagawa, Y. Iwasaki and T. Sutoh IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.171 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

39

IC alignment and layout considerations: S. Strom Electron. Prodn. p.61 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

40

Heat transfer correlations for use in naturally cooled enclosures with high-power integrated circuits: R. D. Flack and B. L. Turner IEEE Trans. Components, Hybrids Mfng Technol. Chmt-3(3), 449 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982

41

On the physics and modeling of small semiconductor devices - I: J. R. Barker and D. K. Ferry Solid-St. Electron. 23, 519 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982

42

On the physics and modeling of small semiconductor devices - II. The very small device: J. R. Barker and D. K. Ferry Solid-St. Electron. 23, 531 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982

43

The influence of VLSI circuitry on the progress of microlithographic equipment: K. Kaschlik Jena Rev. 2, (57) (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982

44

Thermal management techniques keep semiconductors cool: G. Owen Electronics p.135 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982

45

On the physics and modeling of small semiconductor devices - III. Transient response in the finite collision-duration regime: D. K. Ferry and J. R. Barker Solid-St. Electron. 23, 545 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982

46

The use of high magnetic fields for characterisation of impurities in epitaxial GaAs

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 443 KB

english, 1982

47

Transient annealing of ion implanted GaAs

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 627 KB

english, 1982

48

A programmable pseudo-random noise generator: G. Greenshield and J. R. Jordan Microelectron. J. 11(6) 25 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

49

Achieving stability in IC oscillators: I. Refioglu Electronics p.124 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 88 KB

english, 1982

50

Peripheral controller chip ties into 8- and 16-bit systems: J. Banning and P. Lin Electronics p.143 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

51

Design and production of hybrid circuit artwork: A. D. Milne Electrocomp. Sci. Technol. 7, 23 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

52

A method for the computer-assisted design of the topology of thick-film hybrid circuits: W. Burkhardt, D. Hennig, H. Hager and U. Schroter Nachrichtentech. Elektron. 30(9), 359 (1980). (In German)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 131 KB

english, 1982

53

Hybrids with TAB - at the threshold of production: W. R. Rodrigues De Miranda Solid-St. Technol. p.115 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

54

Computer controlled imaging system for automatic hybrid inspection: L. Arlan and R. Wildenberger Solid-St. Technol. p.123 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

55

Mechanism of ceramic capacitor leakage failures due to low DC stress: K. Sato, Y. Ogata, K. Ohno and H. Ikeo IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.205 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

56

A new process for printing fine conductor lines and spaces on large area substrates: H. M. Naguib, K. L. Kavanagh and L. H. Hobbs Solid-St. Technol. p.109 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 141 KB

english, 1982

57

Some observations on the accelerated ageing of thick-film resistors: F. N. Sinnadurai, P. E. Spencer and K. J. Wilson Electrocomponent Sci. Technol. 6, 241 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

58

Calculation and design of thick-film resistors: H. Thust, M. Trommer, E. Fehse and D. Thoss Nachrichtentech. Elektron. 30(9), 356 (1980). (In German.)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

59

Failure analysis of multilayer ceramic substrates: G. A. Walker IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.227 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

60

X-ray resist materials: G. N. Taylor Solid-St. Technol. p.73 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 150 KB

english, 1982

61

The lubrication of gold surfaces by plasma-deposited thin films of fluorocarbon polymer: K. R. Walton IEEE Trans. Components, Hybrids Mfng Technol. Chmt-3(2), p.297 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

62

Moisture uptake and release by plastic molding compounds - its relationship to system life and failure mode: D. W. Dycus IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.293 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

63

Generic reliability of the high-conductivity TaSi2/n+ poly-Si gate MOS structure: A. K. Sinha, D. B. Fraser and S. P. Murarka IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p.159 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

64

The longitudinal diffusion coefficient and the mobility of hot electrons in silicon: G. Bosman, R. J. J. Zijlstra and F. Nava Solid-St. Electron. 24, 5 (1981)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

65

Scaling the barriers to VLSI's fine lines: J. Lyman Electronics p.115 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 140 KB

english, 1982

66

Interface charges beneath laser-annealed insulators on silicon: T. I. Kamins, K. F. Lee and J. F. Gibbons Solid-St. Electron. 23, 1037 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982

67

Chips detects errors in 25 ns: B. Le Boss Electronics (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982

68

A study of diffused bipolar transistors by electron microscopy: C. J. Bull, P. Ashburn and J. P. Gowers Solid-St. Electron. 23, 953 (1980)

Journal:

Microelectronics Journal

Année:

1982

Langue:

english

Fichier:

PDF, 136 KB

english, 1982