Volume 53; Issue 4

Journal of Applied Crystallography

Volume 53; Issue 4

1

GIWAXS-SIIRkit : scattering intensity, indexing and refraction calculation toolkit for grazing-incidence wide-angle X-ray scattering of organic materials

Savikhin, Victoria, SteinrÃ¼ck, Hans-Georg, Liang, Ru-Ze, Collins, Brian A., Oosterhout, Stefan D., Beaujuge, Pierre M., Toney, Michael F.

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 2.16 MB

2020

2

X-Seed 4 : updates to a program for small-molecule supramolecular crystallography

Barbour, Leonard J.

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 712 KB

2020

3

Defining the hematite topotaxial crystal growth in magnetiteâhematite phase transformation

Braga de Oliveira, FlÃ¡via, Ãlvares da Silva, Gilberto, GraÃ§a, Leonardo Martins

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 1.57 MB

2020

4

Assessment of structure factors for analysis of small-angle scattering data from desired or undesired aggregates

Larsen, Andreas Haahr, Pedersen, Jan Skov, Arleth, Lise

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 1.21 MB

2020

5

In situ temperature profile measurements with high-energy X-rays as a probe of optical floating zone crystal growth environment

Denney, Jonathan J., Wang, Yusu, Corrao, Adam A., Huang, Guanglong, Montiel, David, Zhong, Hui, Dooryhee, Eric, Thornton, Katsuyo, Khalifah, Peter G.

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 1.18 MB

2020

6

Chirok : a post-refinement tool to analyse absolute structure

Dyadkin, Vadim, Pattison, Philip, Chernyshov, Dmitry

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 374 KB

2020

7

A new approach to phason disorder for a decagonal quasicrystal: the moment series expansion of the tiling distribution function for AlCuRh

BugaÅski, Ireneusz, StrzaÅka, Radoslaw, Wolny, Janusz

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 1.50 MB

2020

8

Retrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X-ray reflection analysis

AarÃ£o-Rodrigues, Lorena, Isaac, Augusta, Figueiredo, Roberto B., Malachias, Angelo

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 1.58 MB

2020

9

Viscous-medium-based crystal support in a sample holder for fixed-target serial femtosecond crystallography

Lee, Keondo, Lee, Donghyeon, Baek, Sangwon, Park, Jaehyun, Lee, Sang Jae, Park, Sehan, Chung, Wan Kyun, Lee, Jong-Lam, Cho, Hyun-Soo, Cho, Yunje, Nam, Ki Hyun

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 888 KB

2020

10

A laboratory transmission diffraction Laue setup to evaluate single-crystal quality

Arnaud, Alexiane, Guediche, WijdÃ¨ne, Remacha, ClÃ©ment, Romero, Edward, Proudhon, Henry

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 2.74 MB

2020

11

Resolving pseudosymmetry in tetragonal ZrO 2 using electron backscatter diffraction with a modified dictionary indexing approach

Pang, Edward L., Larsen, Peter M., Schuh, Christopher A.

Journal:

Journal of Applied Crystallography

Année:

2020

Fichier:

PDF, 1.58 MB

2020