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Thickness Alteration of Grain-Boundary Amorphous Films during Creep of a Multiphase Silicon Nitride Ceramic
Qiang Jin, David S. Wilkinson, George C. Weatherly, William E. Luecke, Sheldon M. WiederhornVolume:
84
Année:
2001
Langue:
english
Pages:
5
DOI:
10.1111/j.1151-2916.2001.tb00832.x
Fichier:
PDF, 1.40 MB
english, 2001