LEXES and SIMS as complementary techniques for full quantitative characterization of nanometer structures
C. Hombourger, P.F. Staub, M. Schuhmacher, F. Desse, E. de Chambost, C. HitzmanVolume:
203-204
Année:
2003
Langue:
english
Pages:
4
DOI:
10.1016/s0169-4332(02)00680-3
Fichier:
PDF, 148 KB
english, 2003