Trapping mechanisms in negative bias temperature stressed p-MOSFETs
Christian Schlünder, Ralf Brederlow, Peter Wieczorek, Claus Dahl, Jürgen Holz, Michael Röhner, Sylvia Kessel, Volker Herold, Karl Goser, Werner Weber, Roland ThewesVolume:
39
Année:
1999
Langue:
english
Pages:
6
DOI:
10.1016/s0026-2714(99)00107-9
Fichier:
PDF, 383 KB
english, 1999