Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement
D. Roy, S. Bruyere, E. Vincent, F. MonsieurVolume:
42
Année:
2002
Pages:
4
DOI:
10.1016/s0026-2714(02)00177-4
Fichier:
PDF, 1.82 MB
2002