
Thermal and free carrier concentration mapping during ESD event in smart Power ESD protection devices using an improved laser interferometric technique
C. Fürböck, K. Esmark, M. Litzenberger, D. Pogany, G. Groos, R. Zelsacher, M. Stecher, E. GornikVolume:
40
Année:
2000
Langue:
english
Pages:
6
DOI:
10.1016/s0026-2714(00)00144-x
Fichier:
PDF, 522 KB
english, 2000