Uncertainty analysis of point-by-point sampling complex surfaces using touch probe CMMs: DOE for complex surfaces verification with CMM
Emanuele Modesto Barini, Guido Tosello, Leonardo De ChiffreVolume:
34
Année:
2010
Langue:
english
Pages:
6
DOI:
10.1016/j.precisioneng.2009.06.009
Fichier:
PDF, 789 KB
english, 2010