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Angstrom-to-millimeter characterization of sedimentary rock microstructure
A.P. Radlinski, M.A. Ioannidis, A.L. Hinde, M. Hainbuchner, M. Baron, H. Rauch, S.R. KlineVolume:
274
Année:
2004
Langue:
english
Pages:
6
DOI:
10.1016/j.jcis.2004.02.035
Fichier:
PDF, 421 KB
english, 2004