High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relation to their effect on Jc
J. Wiesner, C. Træholt, J.-G. Wen, H.-W. Zandbergen, G. Wirth, H. FuessVolume:
268
Année:
1996
Langue:
english
Pages:
12
DOI:
10.1016/0921-4534(96)00381-4
Fichier:
PDF, 791 KB
english, 1996