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Thickness and roughness dependence of magnetic flux penetration and critical current densities in YBa2Cu3O7−δ thin films
Ch. Jooss, A. Forkl, R. Warthmann, H.-U. Habermeier, B. Leibold, H. KronmüllerVolume:
266
Année:
1996
Langue:
english
Pages:
18
DOI:
10.1016/0921-4534(96)00339-5
Fichier:
PDF, 1.02 MB
english, 1996