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[IEEE 2020 Information Theory and Applications Workshop (ITA) - San Diego, CA, USA (2020.2.2-2020.2.7)] 2020 Information Theory and Applications Workshop (ITA) - Universal Bayes Consistency in Metric Spaces
Hanneke, Steve, Kontorovich, Aryeh, Sabato, Sivan, Weiss, RoiAnnée:
2020
DOI:
10.1109/ITA50056.2020.9244988
Fichier:
PDF, 499 KB
2020