The morphology of thick evaporated aluminium films and their purity as determined by proton-induced x-ray analysis
Neelkanth G. Dhere, Therezinha P. Arsenio, Bijoy K. PatnaikVolume:
44
Année:
1977
Langue:
english
Pages:
14
DOI:
10.1016/0040-6090(77)90025-6
Fichier:
PDF, 673 KB
english, 1977