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Radiation-induced electrical degradation experiments in the Japan materials testing reactor
Eugene H. Farnum, Tatsuo Shikama, Minoru Narui, Tsutomu Sagawa, Kent ScarboroughVolume:
228
Année:
1996
Langue:
english
Pages:
12
DOI:
10.1016/0022-3115(95)00147-6
Fichier:
PDF, 926 KB
english, 1996