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Revisiting heterogeneous defect prediction methods: How far are we?
Chen, Xiang, Mu, Yanzhou, Liu, Ke, Cui, Zhanqi, Ni, ChaoJournal:
Information and Software Technology
DOI:
10.1016/j.infsof.2020.106441
Date:
September, 2020
Fichier:
PDF, 2.55 MB
2020