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[IEEE 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) - Hammamet, Tunisia (2020.6.7-2020.6.10)] 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) - Digital Memristor emulator based on threshold adaptive model
Bouraoui, Mariem, Barraj, Imen, Abbes, Karim, Masmoudi, MohamedAnnée:
2020
DOI:
10.1109/DTS48731.2020.9196146
Fichier:
PDF, 632 KB
2020