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Demystifying Machine Learning for Signal and Power Integrity Problems in Packaging
Swaminathan, Madhavan, Torun, Hakki Mert, Yu, Huan, Hejase, Jose Ale, Becker, Wiren DaleVolume:
10
Journal:
IEEE Transactions on Components, Packaging and Manufacturing Technology
DOI:
10.1109/TCPMT.2020.3011910
Date:
August, 2020
Fichier:
PDF, 8.63 MB
2020