[IEEE 2020 42nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) in conjunction with the 43rd Annual Conference of the Canadian Medical and Biological Engineering Society - Montreal, QC, Canada (2020.7.20-2020.7.24)] 2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) - Depression Scale Prediction with Cross-Sample Entropy and Deep Learning
Chen, Guan-Yen, Huang, Chih-Mao, Liu, Ho-Ling, Lee, Shwu-Hua, Lee, Tatia Mei-Chun, Lin, Chemin, Wu, Shun-ChiAnnée:
2020
DOI:
10.1109/EMBC44109.2020.9175816
Fichier:
PDF, 634 KB
2020
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