Structural characterization, dielectric, and magnetic properties of Ti-doped YFeO3 multiferroic compound
Solórzano, M., Durán, A., López, R., Mata, J., Falconi, R.Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-020-04007-0
Date:
July, 2020
Fichier:
PDF, 4.38 MB
2020
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