Measurement approaches to develop a fundamental understanding of scratch and mar resistance
Mark R. VanLandingham, Li-Piin Sung, Neng-Kai Chang, Tsun Yen Wu, Shuo-Hung Chang, Vincent D. JardretVolume:
1
Langue:
english
Pages:
10
DOI:
10.1007/s11998-004-0028-9
Date:
October, 2004
Fichier:
PDF, 1.96 MB
english, 2004