
Thickness determination of ultrathin oxide films and its application in magnetic tunnel junctions
J. Joshua Yang, Chengxiang Ji, Ying Yang, Y. Austin Chang, Feng X. Liu, Bharat B. Pant, Allan E. SchultzVolume:
35
Année:
2006
Langue:
english
Pages:
5
DOI:
10.1007/s11664-006-0324-5
Fichier:
PDF, 157 KB
english, 2006