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[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Saving Power by Converting Flip-Flop to 3-Phase Latch-Based Designs
Cheng, Huimei, Li, Xi, Gu, Yichen, Beerel, Peter A.Année:
2020
DOI:
10.23919/DATE48585.2020.9116563
Fichier:
PDF, 648 KB
2020