Fault Diagnosis Using Novel Class-Specific Distributed Monitoring Weighted NaıÌve Bayes: Applications to Process Industry
He, Yan-Lin, Ma, Yongchao, Xu, Yuan, Zhu, Qun-XiongJournal:
Industrial & Engineering Chemistry Research
DOI:
10.1021/acs.iecr.0c01071
Date:
May, 2020
Fichier:
PDF, 4.13 MB
2020
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