Test-Data Generation Guided by Static Defect Detection
Dan Hao, Lu Zhang, Ming-Hao Liu, He Li, Jia-Su SunVolume:
24
Langue:
english
Pages:
10
DOI:
10.1007/s11390-009-9224-5
Date:
March, 2009
Fichier:
PDF, 422 KB
english, 2009