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[IEEE 2020 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2020.2.16-2020.2.20)] 2020 IEEE International Solid- State Circuits Conference - (ISSCC) - 5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance
Sakano, Yorito, Toyoshima, Takahiro, Nakamura, Ryosuke, Asatsuma, Tomohiko, Hattori, Yuki, Yamanaka, Takayuki, Yoshikawa, Ryoichi, Kawazu, Naoki, Matsuura, Tomohiro, Iinuma, Takahiro, Toya, Takahiro,Année:
2020
DOI:
10.1109/ISSCC19947.2020.9063095
Fichier:
PDF, 945 KB
2020