Hot Carrier Degradation-Induced Dynamic Variability in FinFETs: Experiments and Modeling
Yu, Zhuoqing, Sun, Zixuan, Wang, Runsheng, Zhang, Jiayang, Huang, RuVolume:
67
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2974864
Date:
April, 2020
Fichier:
PDF, 7.91 MB
english, 2020
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