Simulation-based methods for model building and refinement in cryo-electron microscopy
Dodd, Thomas, Yan, Chunli, Ivanov, IvayloLangue:
english
Journal:
Journal of Chemical Information and Modeling
DOI:
10.1021/acs.jcim.0c00087
Date:
March, 2020
Fichier:
PDF, 5.45 MB
english, 2020