Dependence of fractal characteristics on the scan size of atomic force microscopy (AFM) phase imaging of aluminum thin films
Mwema, F.M., Akinlabi, E.T., Oladijo, O.P.Langue:
english
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2020.02.316
Date:
March, 2020
Fichier:
PDF, 1.84 MB
english, 2020