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[IEEE 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) - Genoa, Italy (2019.11.27-2019.11.29)] 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) - Pre-Silicon Yield Estimation using Machine Learning Regression
Sandru, Elena-Diana, David, Emilian, Pelz, GeorgAnnée:
2019
DOI:
10.1109/icecs46596.2019.8964997
Fichier:
PDF, 2.30 MB
2019